JETP Letters, volume 106, issue 8, pages 491-497
Tunneling interferometry and measurement of the thickness of ultrathin metallic Pb(111) films
Publication type: Journal Article
Publication date: 2017-10-01
Journal:
JETP Letters
Quartile SCImago
Q2
Quartile WOS
Q4
Impact factor: 1.3
ISSN: 00213640, 10906487
Physics and Astronomy (miscellaneous)
Abstract
Spectra of the differential tunneling conductivity for ultrathin lead films grown on Si(111) 7 × 7 single crystals with a thickness of 9 to 50 ML have been studied by low-temperature scanning tunneling microscopy and spectroscopy. The presence of local maxima of the tunneling conductivity is characteristic of such systems. The energies of maxima of the differential conductivity are determined by the spectrum of quantum-confined states of electrons in a metallic layer and, consequently, the local thickness of the layer. It has been shown that features of the microstructure of substrates, such as steps of monatomic height, structural defects, and inclusions of other materials covered with a lead layer, can be visualized by bias-modulation scanning tunneling spectroscopy.
Citations by journals
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Journal of Physical Chemistry C
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Journal of Physical Chemistry C
3 publications, 50%
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Journal of Physical Chemistry Letters
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Journal of Physical Chemistry Letters
1 publication, 16.67%
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Journal of Physics Condensed Matter
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Journal of Physics Condensed Matter
1 publication, 16.67%
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JETP Letters
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JETP Letters
1 publication, 16.67%
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Citations by publishers
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4
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American Chemical Society (ACS)
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American Chemical Society (ACS)
4 publications, 66.67%
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IOP Publishing
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IOP Publishing
1 publication, 16.67%
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Pleiades Publishing
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Pleiades Publishing
1 publication, 16.67%
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- Statistics recalculated weekly.
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Ustavshchikov S. S. et al. Tunneling interferometry and measurement of the thickness of ultrathin metallic Pb(111) films // JETP Letters. 2017. Vol. 106. No. 8. pp. 491-497.
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Ustavshchikov S. S., Putilov A. V., Aladyshkin A. Y. Tunneling interferometry and measurement of the thickness of ultrathin metallic Pb(111) films // JETP Letters. 2017. Vol. 106. No. 8. pp. 491-497.
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TY - JOUR
DO - 10.1134/S0021364017200127
UR - https://doi.org/10.1134%2FS0021364017200127
TI - Tunneling interferometry and measurement of the thickness of ultrathin metallic Pb(111) films
T2 - JETP Letters
AU - Ustavshchikov, S S
AU - Putilov, A. V.
AU - Aladyshkin, A. Yu.
PY - 2017
DA - 2017/10/01 00:00:00
PB - Pleiades Publishing
SP - 491-497
IS - 8
VL - 106
SN - 0021-3640
SN - 1090-6487
ER -
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@article{2017_Ustavshchikov,
author = {S S Ustavshchikov and A. V. Putilov and A. Yu. Aladyshkin},
title = {Tunneling interferometry and measurement of the thickness of ultrathin metallic Pb(111) films},
journal = {JETP Letters},
year = {2017},
volume = {106},
publisher = {Pleiades Publishing},
month = {oct},
url = {https://doi.org/10.1134%2FS0021364017200127},
number = {8},
pages = {491--497},
doi = {10.1134/S0021364017200127}
}
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MLA
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Ustavshchikov, S. S., et al. “Tunneling interferometry and measurement of the thickness of ultrathin metallic Pb(111) films.” JETP Letters, vol. 106, no. 8, Oct. 2017, pp. 491-497. https://doi.org/10.1134%2FS0021364017200127.