Influence of bismuth on the optical properties of Ge2 Sb2 Te5 thin films
Publication type: Journal Article
Publication date: 2014-05-06
scimago Q4
wos Q4
SJR: 0.154
CiteScore: 0.9
Impact factor: 0.6
ISSN: 10637826, 10906479, 17267315, 09412751
Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Abstract
Chalcogenide alloys in the Ge-Sb-Te system are promising for application in phase-change memory devices. We investigated the influence of bismuth on the optical properties of Ge2Sb2Te5 thin films and established that the bismuth doping in them allows the optical contrast of the thin films to be increased by about 30% at a wavelength of 400 nm. The experimental results are explained in an assumption on the impurity substitution of bismuth for antimony.
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Nguyen H. Ph., Kozyukhin S. A., Pevtsov A. Influence of bismuth on the optical properties of Ge2Sb2Te5 thin films // Semiconductors. 2014. Vol. 48. No. 5. pp. 577-583.
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Nguyen H. Ph., Kozyukhin S. A., Pevtsov A. Influence of bismuth on the optical properties of Ge2Sb2Te5 thin films // Semiconductors. 2014. Vol. 48. No. 5. pp. 577-583.
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TY - JOUR
DO - 10.1134/S1063782614050169
UR - https://doi.org/10.1134/S1063782614050169
TI - Influence of bismuth on the optical properties of Ge2Sb2Te5 thin films
T2 - Semiconductors
AU - Nguyen, H Ph
AU - Kozyukhin, S A
AU - Pevtsov, A.B.
PY - 2014
DA - 2014/05/06
PB - Pleiades Publishing
SP - 577-583
IS - 5
VL - 48
SN - 1063-7826
SN - 1090-6479
SN - 1726-7315
SN - 0941-2751
ER -
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BibTex (up to 50 authors)
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@article{2014_Nguyen,
author = {H Ph Nguyen and S A Kozyukhin and A.B. Pevtsov},
title = {Influence of bismuth on the optical properties of Ge2Sb2Te5 thin films},
journal = {Semiconductors},
year = {2014},
volume = {48},
publisher = {Pleiades Publishing},
month = {may},
url = {https://doi.org/10.1134/S1063782614050169},
number = {5},
pages = {577--583},
doi = {10.1134/S1063782614050169}
}
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MLA
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Nguyen, H. Ph., et al. āInfluence of bismuth on the optical properties of Ge2Sb2Te5 thin films.ā Semiconductors, vol. 48, no. 5, May. 2014, pp. 577-583. https://doi.org/10.1134/S1063782614050169.
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