Design pattern density defined

Dirk Riehle ¹

SAP Labs LLC, Palo Alto, CA, USA |

Publication type: Proceedings Article

Publication date: 2009-10-25

Association for Computing Machinery (ACM)

DOI: 10.1145/1640089.1640125

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ACM Transactions on Software Engineering and Methodology	ACM Transactions on Software Engineering and Methodology, 2, 40% ACM Transactions on Software Engineering and Methodology 2 publications, 40%
Lecture Notes in Computer Science	Lecture Notes in Computer Science, 1, 20% Lecture Notes in Computer Science 1 publication, 20%
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Association for Computing Machinery (ACM)	Association for Computing Machinery (ACM), 2, 40% Association for Computing Machinery (ACM) 2 publications, 40%
Springer Nature	Springer Nature, 1, 20% Springer Nature 1 publication, 20%
Institute of Electrical and Electronics Engineers (IEEE)	Institute of Electrical and Electronics Engineers (IEEE), 1, 20% Institute of Electrical and Electronics Engineers (IEEE) 1 publication, 20%
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Association for Computing Machinery (ACM)