Bulletin of the Chemical Society of Japan, volume 73, issue 7, pages 1581-1587

Site-Selective X-Ray Absorption Fine Structure (XAFS) Spectroscopy (2). XAFS Spectra Tuned to Surface Active Sites of Cu/ZnO and Cr/SiO2Catalysts

Yasuo Izumi
Hiroyasu Nagamori
Publication typeJournal Article
Publication date2000-07-01
Quartile SCImago
Q1
Quartile WOS
Q2
Impact factor4
ISSN00092673, 13480634
General Chemistry
Abstract
Site-selective XAFS spectra were measured by tuning the Rowland-type fluorescence spectrometer to each site of Cu/ZnO and Cr/SiO2 catalysts. The chemical shifts between Cu0 and CuI sites and between CrIII and CrVI sites were relatively large for model compounds (ΔE = 1.6 eV), and were utilized as the tune energies of site-selective XAFS. Site-selective XANES tuned to Cu0, CuI, and CrIII sites were successfully obtained. Based on the correlation between the chemical shift and the peak width (energy resolution of the fluorescence spectrometer), site-selective XANES spectra were analyzed. The population ratio of Cu metal, Cu2O, and CuI atomically dispersed on ZnO was estimated to be 70(±23) : 22(±14) : 8(±5). The contribution of the CrIII site to site-selective XANES tuned to the CrIII site was 94(±3)%.

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Izumi Y., Nagamori H. Site-Selective X-Ray Absorption Fine Structure (XAFS) Spectroscopy (2). XAFS Spectra Tuned to Surface Active Sites of Cu/ZnO and Cr/SiO2Catalysts // Bulletin of the Chemical Society of Japan. 2000. Vol. 73. No. 7. pp. 1581-1587.
GOST all authors (up to 50) Copy
Izumi Y., Nagamori H. Site-Selective X-Ray Absorption Fine Structure (XAFS) Spectroscopy (2). XAFS Spectra Tuned to Surface Active Sites of Cu/ZnO and Cr/SiO2Catalysts // Bulletin of the Chemical Society of Japan. 2000. Vol. 73. No. 7. pp. 1581-1587.
RIS |
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RIS Copy
TY - JOUR
DO - 10.1246/bcsj.73.1581
UR - https://doi.org/10.1246/bcsj.73.1581
TI - Site-Selective X-Ray Absorption Fine Structure (XAFS) Spectroscopy (2). XAFS Spectra Tuned to Surface Active Sites of Cu/ZnO and Cr/SiO2Catalysts
T2 - Bulletin of the Chemical Society of Japan
AU - Izumi, Yasuo
AU - Nagamori, Hiroyasu
PY - 2000
DA - 2000/07/01 00:00:00
PB - The Chemical Society of Japan
SP - 1581-1587
IS - 7
VL - 73
SN - 0009-2673
SN - 1348-0634
ER -
BibTex |
Cite this
BibTex Copy
@article{2000_Izumi,
author = {Yasuo Izumi and Hiroyasu Nagamori},
title = {Site-Selective X-Ray Absorption Fine Structure (XAFS) Spectroscopy (2). XAFS Spectra Tuned to Surface Active Sites of Cu/ZnO and Cr/SiO2Catalysts},
journal = {Bulletin of the Chemical Society of Japan},
year = {2000},
volume = {73},
publisher = {The Chemical Society of Japan},
month = {jul},
url = {https://doi.org/10.1246/bcsj.73.1581},
number = {7},
pages = {1581--1587},
doi = {10.1246/bcsj.73.1581}
}
MLA
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MLA Copy
Izumi, Yasuo, and Hiroyasu Nagamori. “Site-Selective X-Ray Absorption Fine Structure (XAFS) Spectroscopy (2). XAFS Spectra Tuned to Surface Active Sites of Cu/ZnO and Cr/SiO2Catalysts.” Bulletin of the Chemical Society of Japan, vol. 73, no. 7, Jul. 2000, pp. 1581-1587. https://doi.org/10.1246/bcsj.73.1581.
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