Open Access
Open access
volume 11 issue 16 pages 7632

Attenuated Total Reflection at THz Wavelengths: Prospective Use of Total Internal Reflection and Polariscopy

Meguya Ryu 1, 2
Soon Hock Ng 3
Stefan Lundgaard 3
Jingwen Hu 3
Tomas Katkus 3
Dominique Appadoo 4
Zoltan Vilagosh 5
Andrew W Wood 5
Junko Morikawa 2
Publication typeJournal Article
Publication date2021-08-19
scimago Q2
wos Q2
SJR0.521
CiteScore5.5
Impact factor2.5
ISSN20763417
Computer Science Applications
Process Chemistry and Technology
General Materials Science
Instrumentation
General Engineering
Fluid Flow and Transfer Processes
Abstract

Capabilities of the attenuated total reflection (ATR) at THz wavelengths for increased sub-surface depth characterisation of (bio-)materials are presented. The penetration depth of a THz evanescent wave in biological samples is dependent on the wavelength and temperature and can reach 0.1–0.5 mm depth, due to the strong refractive index change ∼0.4 of the ice-water transition; this is quite significant and important when studying biological samples. Technical challenges are discussed when using ATR for uneven, heterogeneous, high refractive index samples with the possibility of frustrated total internal reflection (a breakdown of the ATR reflection mode into transmission mode). Local field enhancements at the interface are discussed with numerical/analytical examples. Maxwell’s scaling is used to model the behaviour of absorber–scatterer inside the materials at the interface with the ATR prism for realistic complex refractive indices of bio-materials. The modality of ATR with a polarisation analysis is proposed, and its principle is illustrated, opening an invitation for its experimental validation. The sensitivity of the polarised ATR mode to the refractive index between the sample and ATR prism is numerically modelled and experimentally verified for background (air) spectra. The design principles of polarisation active optical elements and spectral filters are outlined. The results and proposed concepts are based on experimental conditions at the THz beamline of the Australian Synchrotron.

Found 
Found 

Top-30

Journals

1
Nanomaterials
1 publication, 5.88%
Optics
1 publication, 5.88%
Micromachines
1 publication, 5.88%
ACS Applied Nano Materials
1 publication, 5.88%
IEEE Transactions on Terahertz Science and Technology
1 publication, 5.88%
Nanoscale Horizons
1 publication, 5.88%
Optical Materials Express
1 publication, 5.88%
Chemistry - An Asian Journal
1 publication, 5.88%
Applied Spectroscopy
1 publication, 5.88%
Frontiers in Plant Science
1 publication, 5.88%
Applied Physics B: Lasers and Optics
1 publication, 5.88%
Computers in Biology and Medicine
1 publication, 5.88%
1

Publishers

1
2
3
MDPI
3 publications, 17.65%
Springer Nature
2 publications, 11.76%
American Chemical Society (ACS)
1 publication, 5.88%
Institute of Electrical and Electronics Engineers (IEEE)
1 publication, 5.88%
Royal Society of Chemistry (RSC)
1 publication, 5.88%
Optica Publishing Group
1 publication, 5.88%
Wiley
1 publication, 5.88%
SAGE
1 publication, 5.88%
Frontiers Media S.A.
1 publication, 5.88%
Elsevier
1 publication, 5.88%
1
2
3
  • We do not take into account publications without a DOI.
  • Statistics recalculated weekly.

Are you a researcher?

Create a profile to get free access to personal recommendations for colleagues and new articles.
Metrics
17
Share
Cite this
GOST |
Cite this
GOST Copy
Ryu M. et al. Attenuated Total Reflection at THz Wavelengths: Prospective Use of Total Internal Reflection and Polariscopy // Applied Sciences (Switzerland). 2021. Vol. 11. No. 16. p. 7632.
GOST all authors (up to 50) Copy
Ryu M., Ng S. H., Anand V., Lundgaard S., Hu J., Katkus T., Appadoo D., Vilagosh Z., Wood A. W., Juodkazis S., Morikawa J. Attenuated Total Reflection at THz Wavelengths: Prospective Use of Total Internal Reflection and Polariscopy // Applied Sciences (Switzerland). 2021. Vol. 11. No. 16. p. 7632.
RIS |
Cite this
RIS Copy
TY - JOUR
DO - 10.3390/app11167632
UR - https://doi.org/10.3390/app11167632
TI - Attenuated Total Reflection at THz Wavelengths: Prospective Use of Total Internal Reflection and Polariscopy
T2 - Applied Sciences (Switzerland)
AU - Ryu, Meguya
AU - Ng, Soon Hock
AU - Anand, Vijayakumar
AU - Lundgaard, Stefan
AU - Hu, Jingwen
AU - Katkus, Tomas
AU - Appadoo, Dominique
AU - Vilagosh, Zoltan
AU - Wood, Andrew W
AU - Juodkazis, Saulius
AU - Morikawa, Junko
PY - 2021
DA - 2021/08/19
PB - MDPI
SP - 7632
IS - 16
VL - 11
SN - 2076-3417
ER -
BibTex |
Cite this
BibTex (up to 50 authors) Copy
@article{2021_Ryu,
author = {Meguya Ryu and Soon Hock Ng and Vijayakumar Anand and Stefan Lundgaard and Jingwen Hu and Tomas Katkus and Dominique Appadoo and Zoltan Vilagosh and Andrew W Wood and Saulius Juodkazis and Junko Morikawa},
title = {Attenuated Total Reflection at THz Wavelengths: Prospective Use of Total Internal Reflection and Polariscopy},
journal = {Applied Sciences (Switzerland)},
year = {2021},
volume = {11},
publisher = {MDPI},
month = {aug},
url = {https://doi.org/10.3390/app11167632},
number = {16},
pages = {7632},
doi = {10.3390/app11167632}
}
MLA
Cite this
MLA Copy
Ryu, Meguya, et al. “Attenuated Total Reflection at THz Wavelengths: Prospective Use of Total Internal Reflection and Polariscopy.” Applied Sciences (Switzerland), vol. 11, no. 16, Aug. 2021, p. 7632. https://doi.org/10.3390/app11167632.