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The Distance between Minima of Electron Density and Electrostatic Potential as a Measure of Halogen Bond Strength

Тип публикацииJournal Article
Дата публикации2022-07-28
SCImago Q1
WOS Q2
БС1
SJR0.915
CiteScore10.3
Impact factor5.1
ISSN14203049
Organic Chemistry
Drug Discovery
Physical and Theoretical Chemistry
Pharmaceutical Science
Molecular Medicine
Analytical Chemistry
Chemistry (miscellaneous)
Краткое описание

In this study, we present results of a detailed topological analysis of electron density (ED) of 145 halogen-bonded complexes formed by various fluorine-, chlorine-, bromine-, and iodine-containing compounds with trimethylphosphine oxide, Me3PO. To characterize the halogen bond (XB) strength, we used the complexation enthalpy, the interatomic distance between oxygen and halogen, as well as the typical set of electron density properties at the bond critical points calculated at B3LYP/jorge-ATZP level of theory. We show for the first time that it is possible to predict the XB strength based on the distance between the minima of ED and molecular electrostatic potential (ESP) along the XB path. The gap between ED and ESP minima exponentially depends on local electronic kinetic energy density at the bond critical point and tends to be a common limiting value for the strongest halogen bond.

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ГОСТ |
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Chakalov E. R. et al. The Distance between Minima of Electron Density and Electrostatic Potential as a Measure of Halogen Bond Strength // Molecules. 2022. Vol. 27. No. 15. p. 4848.
ГОСТ со всеми авторами (до 50) Скопировать
Chakalov E. R., Tupikina E. Yu., Ivanov D. M., Bartashevich E. V., Tolstoy P. M. The Distance between Minima of Electron Density and Electrostatic Potential as a Measure of Halogen Bond Strength // Molecules. 2022. Vol. 27. No. 15. p. 4848.
RIS |
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TY - JOUR
DO - 10.3390/molecules27154848
UR - https://www.mdpi.com/1420-3049/27/15/4848
TI - The Distance between Minima of Electron Density and Electrostatic Potential as a Measure of Halogen Bond Strength
T2 - Molecules
AU - Chakalov, Edem R
AU - Tupikina, E Yu
AU - Ivanov, Daniil M
AU - Bartashevich, Ekaterina V.
AU - Tolstoy, Peter M.
PY - 2022
DA - 2022/07/28
PB - MDPI
SP - 4848
IS - 15
VL - 27
PMID - 35956799
SN - 1420-3049
ER -
BibTex |
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BibTex (до 50 авторов) Скопировать
@article{2022_Chakalov,
author = {Edem R Chakalov and E Yu Tupikina and Daniil M Ivanov and Ekaterina V. Bartashevich and Peter M. Tolstoy},
title = {The Distance between Minima of Electron Density and Electrostatic Potential as a Measure of Halogen Bond Strength},
journal = {Molecules},
year = {2022},
volume = {27},
publisher = {MDPI},
month = {jul},
url = {https://www.mdpi.com/1420-3049/27/15/4848},
number = {15},
pages = {4848},
doi = {10.3390/molecules27154848}
}
MLA
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Chakalov, Edem R., et al. “The Distance between Minima of Electron Density and Electrostatic Potential as a Measure of Halogen Bond Strength.” Molecules, vol. 27, no. 15, Jul. 2022, p. 4848. https://www.mdpi.com/1420-3049/27/15/4848.
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