XPS study of epitaxial LaNiO3-xfilms
Publication type: Journal Article
Publication date: 2006-01-01
scimago Q4
wos Q4
SJR: 0.155
CiteScore: 0.9
Impact factor: 0.6
ISSN: 16488504, 24243647
General Physics and Astronomy
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Metrics
16
Total citations:
16
Citations from 2025:
2
(12.5%)
Cite this
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BibTex |
MLA
Cite this
RIS
Copy
TY - JOUR
DO - 10.3952/lithjphys.46114
UR - https://doi.org/10.3952/lithjphys.46114
TI - XPS study of epitaxial LaNiO3-xfilms
T2 - Lithuanian Journal of Physics
AU - Bondarenka, V
PY - 2006
DA - 2006/01/01
PB - Lithuanian Physical Society
SP - 95-99
IS - 1
VL - 46
SN - 1648-8504
SN - 2424-3647
ER -
Cite this
BibTex (up to 50 authors)
Copy
@article{2006_Bondarenka,
author = {V Bondarenka},
title = {XPS study of epitaxial LaNiO3-xfilms},
journal = {Lithuanian Journal of Physics},
year = {2006},
volume = {46},
publisher = {Lithuanian Physical Society},
month = {jan},
url = {https://doi.org/10.3952/lithjphys.46114},
number = {1},
pages = {95--99},
doi = {10.3952/lithjphys.46114}
}
Cite this
MLA
Copy
Bondarenka, V.. “XPS study of epitaxial LaNiO3-xfilms.” Lithuanian Journal of Physics, vol. 46, no. 1, Jan. 2006, pp. 95-99. https://doi.org/10.3952/lithjphys.46114.