Electron Microscopy Research Group
Publications
36
Citations
455
h-index
11
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The Electron Microscopy Research Group solves the problems of analytical and quantitative microscopy, local elemental analysis, and crystallographic analysis in micro-regions.
- High-resolution transmission microscopy
- Scanning electron microscopy (SEM)
- Energy dispersive X-ray spectroscopy
- Inductively coupled plasma atomic emission spectrometry
Research directions
Scanning and transmission electron microscopy
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The Group has two transmission electron microscopes JEM-2000EX from JEOL (Japan), scanning electron microscopes JSM-840A and JXA-6400. These microscopes are equipped with an X-ray dispersion and wave spectrometer for massive samples (SERIES II from Noran) and thin foils (INKA ENERGY TEM 200 from Oxfords Instruments), a system for analyzing the crystallographic structure of massive polycrystalline samples using the method of registration of back-reflected electrons (EBSD) (INKA CRYSTAL 300 from Oxfords Instruments). The laboratory also has equipment for making samples for both transmission and scanning electron microscopes. This is a device for electrolytic thinning of metal samples "TENUPOL 5" from STRUERS, a device from GATAN for thinning by ion bombardment of non-conductive samples.
Publications and patents
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Lab address
ул. Степана Халтурина, 39, Уфа, Респ. Башкортостан
Authorization required.