Atomic force microscopy (AFM)
Conductometry
Determination of interfacial tension
Determination of the flash point
Determination of the wetting edge angle
Determination of the zeta potential using the Malvern Zeta-sizer Nano ZS device
Dynamic light scattering (DLS)
English translation
Excel
Extraction
Fluorimetry
Gel electrophoresis
IR spectroscopy
Immobilization of enzymes on substrates
LaTex
Labor protection in the laboratory
NMR spectroscopy
Optical microscopy
OriginLab
Scanning electron microscopy (SEM)
Spectrophotometry
Synthesis of nanoparticles
Synthesis of quantum dots
Technical English
