volume 22 issue 30 pages 3256-3259

High-Resolution Transmission X-ray Microscopy: A New Tool for Mesoscopic Materials

Publication typeJournal Article
Publication date2010-06-08
scimago Q1
wos Q1
SJR8.851
CiteScore39.4
Impact factor26.8
ISSN09359648, 15214095
General Materials Science
Mechanical Engineering
Mechanics of Materials
Abstract
High-resolution transmission X-ray microscopy (HRTXM), combined with X-ray diffraction, is a valuable tool for the volume-specific studies of periodic mesoscopic structures, such as photonic crystals. A case study performed on a prototypical photonic crystal - gem opal - sheds some light on the opals genesis processes.
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GOST |
Cite this
GOST Copy
Bosak A. et al. High-Resolution Transmission X-ray Microscopy: A New Tool for Mesoscopic Materials // Advanced Materials. 2010. Vol. 22. No. 30. pp. 3256-3259.
GOST all authors (up to 50) Copy
Bosak A., Snigireva I., Napolskii K. S., Snigirev A. High-Resolution Transmission X-ray Microscopy: A New Tool for Mesoscopic Materials // Advanced Materials. 2010. Vol. 22. No. 30. pp. 3256-3259.
RIS |
Cite this
RIS Copy
TY - JOUR
DO - 10.1002/adma.201000173
UR - https://doi.org/10.1002/adma.201000173
TI - High-Resolution Transmission X-ray Microscopy: A New Tool for Mesoscopic Materials
T2 - Advanced Materials
AU - Bosak, Alexey
AU - Snigireva, Irina
AU - Napolskii, Kirill S.
AU - Snigirev, Anatoly
PY - 2010
DA - 2010/06/08
PB - Wiley
SP - 3256-3259
IS - 30
VL - 22
PMID - 20533418
SN - 0935-9648
SN - 1521-4095
ER -
BibTex |
Cite this
BibTex (up to 50 authors) Copy
@article{2010_Bosak,
author = {Alexey Bosak and Irina Snigireva and Kirill S. Napolskii and Anatoly Snigirev},
title = {High-Resolution Transmission X-ray Microscopy: A New Tool for Mesoscopic Materials},
journal = {Advanced Materials},
year = {2010},
volume = {22},
publisher = {Wiley},
month = {jun},
url = {https://doi.org/10.1002/adma.201000173},
number = {30},
pages = {3256--3259},
doi = {10.1002/adma.201000173}
}
MLA
Cite this
MLA Copy
Bosak, Alexey, et al. “High-Resolution Transmission X-ray Microscopy: A New Tool for Mesoscopic Materials.” Advanced Materials, vol. 22, no. 30, Jun. 2010, pp. 3256-3259. https://doi.org/10.1002/adma.201000173.