Advanced Materials, volume 22, issue 30, pages 3256-3259

High-Resolution Transmission X-ray Microscopy: A New Tool for Mesoscopic Materials

Bosak Alexey ¹

Snigireva Irina ¹

Napolskii Kirill S. ²

Snigirev Anatoly ¹

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European Synchrotron Radiation Facility, 6 Rue Jules Horowitz, 38043 Grenoble (France) |

Department of Materials Science, M. V. Lomonosov Moscow State University, 119991 Moscow, Russia |

Publication type: Journal Article

Publication date: 2010-06-08

Wiley

Journal: Advanced Materials

Quartile SCImago

Quartile WOS

Impact factor: 29.4

ISSN: 09359648, 15214095

DOI: 10.1002/adma.201000173

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General Materials Science

Mechanical Engineering

Mechanics of Materials

Abstract

High-resolution transmission X-ray microscopy (HRTXM), combined with X-ray diffraction, is a valuable tool for the volume-specific studies of periodic mesoscopic structures, such as photonic crystals. A case study performed on a prototypical photonic crystal - gem opal - sheds some light on the opals genesis processes.

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Citations by journals

	2 4 6 8 10 12
Journal of Synchrotron Radiation	Journal of Synchrotron Radiation, 11, 12.5% Journal of Synchrotron Radiation 11 publications, 12.5%
Optics Express	Optics Express, 6, 6.82% Optics Express 6 publications, 6.82%
Journal of Applied Crystallography	Journal of Applied Crystallography, 5, 5.68% Journal of Applied Crystallography 5 publications, 5.68%
Journal of Physical Chemistry C	Journal of Physical Chemistry C, 3, 3.41% Journal of Physical Chemistry C 3 publications, 3.41%
AIP Conference Proceedings	AIP Conference Proceedings, 3, 3.41% AIP Conference Proceedings 3 publications, 3.41%
Physical Review B	Physical Review B, 2, 2.27% Physical Review B 2 publications, 2.27%
Review of Scientific Instruments	Review of Scientific Instruments, 2, 2.27% Review of Scientific Instruments 2 publications, 2.27%
Scientific Reports	Scientific Reports, 2, 2.27% Scientific Reports 2 publications, 2.27%
MRS Bulletin	MRS Bulletin, 2, 2.27% MRS Bulletin 2 publications, 2.27%
Acta Materialia	Acta Materialia, 2, 2.27% Acta Materialia 2 publications, 2.27%
Small	Small, 2, 2.27% Small 2 publications, 2.27%
Langmuir	Langmuir, 2, 2.27% Langmuir 2 publications, 2.27%
Crystallography Reports	Crystallography Reports, 2, 2.27% Crystallography Reports 2 publications, 2.27%
Soft Matter	Soft Matter, 2, 2.27% Soft Matter 2 publications, 2.27%
Proceedings of SPIE - The International Society for Optical Engineering	Proceedings of SPIE - The International Society for Optical Engineering, 2, 2.27% Proceedings of SPIE - The International Society for Optical Engineering 2 publications, 2.27%
Synchrotron Radiation News	Synchrotron Radiation News, 2, 2.27% Synchrotron Radiation News 2 publications, 2.27%
Microscopy and Microanalysis	Microscopy and Microanalysis, 2, 2.27% Microscopy and Microanalysis 2 publications, 2.27%
Angewandte Chemie - International Edition	Angewandte Chemie - International Edition, 1, 1.14% Angewandte Chemie - International Edition 1 publication, 1.14%
Physical Review Letters	Physical Review Letters, 1, 1.14% Physical Review Letters 1 publication, 1.14%
AIP Advances	AIP Advances, 1, 1.14% AIP Advances 1 publication, 1.14%
Communications Materials	Communications Materials, 1, 1.14% Communications Materials 1 publication, 1.14%
Advances in Laboratory-based X-Ray Sources, Optics, and Applications VI	Advances in Laboratory-based X-Ray Sources, Optics, and Applications VI, 1, 1.14% Advances in Laboratory-based X-Ray Sources, Optics, and Applications VI 1 publication, 1.14%
Nature Photonics	Nature Photonics, 1, 1.14% Nature Photonics 1 publication, 1.14%
Physics Letters, Section A: General, Atomic and Solid State Physics	Physics Letters, Section A: General, Atomic and Solid State Physics, 1, 1.14% Physics Letters, Section A: General, Atomic and Solid State Physics 1 publication, 1.14%
Progress in Materials Science	Progress in Materials Science, 1, 1.14% Progress in Materials Science 1 publication, 1.14%
IOP Conference Series: Materials Science and Engineering	IOP Conference Series: Materials Science and Engineering, 1, 1.14% IOP Conference Series: Materials Science and Engineering 1 publication, 1.14%
Journal Physics D: Applied Physics	Journal Physics D: Applied Physics, 1, 1.14% Journal Physics D: Applied Physics 1 publication, 1.14%
Journal of Physics: Conference Series	Journal of Physics: Conference Series, 1, 1.14% Journal of Physics: Conference Series 1 publication, 1.14%
Microelectronic Engineering	Microelectronic Engineering, 1, 1.14% Microelectronic Engineering 1 publication, 1.14%

	2 4 6 8 10 12

Citations by publishers

	2 4 6 8 10 12 14 16 18
Wiley	Wiley, 17, 19.32% Wiley 17 publications, 19.32%
Elsevier	Elsevier, 11, 12.5% Elsevier 11 publications, 12.5%
American Chemical Society (ACS)	American Chemical Society (ACS), 7, 7.95% American Chemical Society (ACS) 7 publications, 7.95%
American Institute of Physics (AIP)	American Institute of Physics (AIP), 7, 7.95% American Institute of Physics (AIP) 7 publications, 7.95%
Optical Society of America	Optical Society of America, 7, 7.95% Optical Society of America 7 publications, 7.95%
International Union of Crystallography (IUCr)	International Union of Crystallography (IUCr), 5, 5.68% International Union of Crystallography (IUCr) 5 publications, 5.68%
Springer Nature	Springer Nature, 4, 4.55% Springer Nature 4 publications, 4.55%
American Physical Society (APS)	American Physical Society (APS), 3, 3.41% American Physical Society (APS) 3 publications, 3.41%
IOP Publishing	IOP Publishing, 3, 3.41% IOP Publishing 3 publications, 3.41%
Pleiades Publishing	Pleiades Publishing, 3, 3.41% Pleiades Publishing 3 publications, 3.41%
Royal Society of Chemistry (RSC)	Royal Society of Chemistry (RSC), 3, 3.41% Royal Society of Chemistry (RSC) 3 publications, 3.41%
Cambridge University Press	Cambridge University Press, 2, 2.27% Cambridge University Press 2 publications, 2.27%
SPIE	SPIE, 2, 2.27% SPIE 2 publications, 2.27%
Taylor & Francis	Taylor & Francis, 2, 2.27% Taylor & Francis 2 publications, 2.27%
Oxford University Press	Oxford University Press, 2, 2.27% Oxford University Press 2 publications, 2.27%
SAGE	SAGE, 1, 1.14% SAGE 1 publication, 1.14%
	2 4 6 8 10 12 14 16 18

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Bosak A. et al. High-Resolution Transmission X-ray Microscopy: A New Tool for Mesoscopic Materials // Advanced Materials. 2010. Vol. 22. No. 30. pp. 3256-3259.

GOST all authors (up to 50) Copy

Bosak A., Snigireva I., Napolskii K. S., Snigirev A. High-Resolution Transmission X-ray Microscopy: A New Tool for Mesoscopic Materials // Advanced Materials. 2010. Vol. 22. No. 30. pp. 3256-3259.

RIS |

Cite this

RIS Copy

TY - JOUR

DO - 10.1002/adma.201000173

UR - https://doi.org/10.1002%2Fadma.201000173

TI - High-Resolution Transmission X-ray Microscopy: A New Tool for Mesoscopic Materials

T2 - Advanced Materials

AU - Bosak, Alexey

AU - Snigireva, Irina

AU - Napolskii, Kirill S.

AU - Snigirev, Anatoly

PY - 2010

DA - 2010/06/08 00:00:00

PB - Wiley

SP - 3256-3259

IS - 30

VL - 22

SN - 0935-9648

SN - 1521-4095

ER -

BibTex |

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BibTex Copy

@article{2010_Bosak,

author = {Alexey Bosak and Irina Snigireva and Kirill S. Napolskii and Anatoly Snigirev},

title = {High-Resolution Transmission X-ray Microscopy: A New Tool for Mesoscopic Materials},

journal = {Advanced Materials},

year = {2010},

volume = {22},

publisher = {Wiley},

month = {jun},

url = {https://doi.org/10.1002%2Fadma.201000173},

number = {30},

pages = {3256--3259},

doi = {10.1002/adma.201000173}

}

MLA

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MLA Copy

Bosak, Alexey, et al. “High-Resolution Transmission X-ray Microscopy: A New Tool for Mesoscopic Materials.” Advanced Materials, vol. 22, no. 30, Jun. 2010, pp. 3256-3259. https://doi.org/10.1002%2Fadma.201000173.

Found error?

Publisher

Wiley

Journal

Advanced Materials

Quartile SCImago

Quartile WOS

Impact factor

29.4

ISSN

09359648 (Print)
15214095 (Electronic)

Labs

Electrochemical Nanostructuring Group

Profiles

Napolskii, Kirill S