том 223 издание 1 страницы 51-55

Study of diffusion in thin AuCu films

Тип публикацииJournal Article
Дата публикации1993-01-01
scimago Q2
wos Q3
БС1
SJR0.419
CiteScore3.9
Impact factor2.0
ISSN00406090, 18792731
Materials Chemistry
Metals and Alloys
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Краткое описание
Temperature dependences of the volume and grain boundary diffusion coefficients of copper and gold were obtained from Rutherford backscattering spectrometry (RBS) investigations of multilayer CuAu targets. The annealing of films was carried out in vacuum in the temperature range from 448 to 523 K. All stages of annealing of the film targets were tested by He+ RBS (E0=1.5 MeV), and element depth concentration profiles were interpreted on the basis of the Whipple theory and Gilmer-Farrell analysis. Grain boundary diffusion coefficients and the corresponding Arrhenius parameters were obtained.
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ГОСТ |
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ALESHIN A. N. et al. Study of diffusion in thin AuCu films // Thin Solid Films. 1993. Vol. 223. No. 1. pp. 51-55.
ГОСТ со всеми авторами (до 50) Скопировать
ALESHIN A. N., Egorov V., Bokstein B., Kurkin P. V. Study of diffusion in thin AuCu films // Thin Solid Films. 1993. Vol. 223. No. 1. pp. 51-55.
RIS |
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TY - JOUR
DO - 10.1016/0040-6090(93)90726-6
UR - https://doi.org/10.1016/0040-6090(93)90726-6
TI - Study of diffusion in thin AuCu films
T2 - Thin Solid Films
AU - ALESHIN, A. N.
AU - Egorov, V.K.
AU - Bokstein, B.S
AU - Kurkin, P V
PY - 1993
DA - 1993/01/01
PB - Elsevier
SP - 51-55
IS - 1
VL - 223
SN - 0040-6090
SN - 1879-2731
ER -
BibTex |
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BibTex (до 50 авторов) Скопировать
@article{1993_ALESHIN,
author = {A. N. ALESHIN and V.K. Egorov and B.S Bokstein and P V Kurkin},
title = {Study of diffusion in thin AuCu films},
journal = {Thin Solid Films},
year = {1993},
volume = {223},
publisher = {Elsevier},
month = {jan},
url = {https://doi.org/10.1016/0040-6090(93)90726-6},
number = {1},
pages = {51--55},
doi = {10.1016/0040-6090(93)90726-6}
}
MLA
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ALESHIN, A. N., et al. “Study of diffusion in thin AuCu films.” Thin Solid Films, vol. 223, no. 1, Jan. 1993, pp. 51-55. https://doi.org/10.1016/0040-6090(93)90726-6.