Segregation effect on grain-boundary diffusion in thin metallic films
Publication type: Journal Article
Publication date: 1996-04-01
scimago Q2
wos Q3
SJR: 0.419
CiteScore: 3.9
Impact factor: 2.0
ISSN: 00406090, 18792731
Materials Chemistry
Metals and Alloys
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Abstract
The diffusion in Au-Cu and Pt-Cu thin films has been studied by Rutherford backscattering sperctrometry ( RBS ) under the kinetic regimes B (within the temperature interval of 175-290°C and C (room temperature). The 1.5-2.0 MeV He + RBS spectra were taken using 14-18 keV resolution. The RBS spectra were changed to depth-concentration profiles for both bulk and grain boundary (GB) diffusion. Under kinetic regime C the absolute values of GB diffusion coefficients were obtained. Under kinetic regime B the triple products δKD h (δ is the GB width, D b is the GB diffusion coefficient, K is the enrichment ratio) were obtained using the Whipple and Gilmer-Farrell models. The activation energies for GB diffusion of Au into Cu films and Cu into Au films are close to 0.95-0.98 eV atom -1 , whereas the activation energy for GB diffusion of Pt into Cu films is equal to 1.25 eV atom -1 . The comparison between the data on the GB diffusion for kinetic regime B extrapolated to room temperature and the data on the GB diffusion for kinetic regime C enables one to derive the product δK and to separate the contribution of segregation to the parameters of GB diffusion for the systems under study.
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ALESHIN A. N. et al. Segregation effect on grain-boundary diffusion in thin metallic films // Thin Solid Films. 1996. Vol. 275. No. 1-2. pp. 144-147.
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ALESHIN A. N., Bokstein B., Egorov V., Kurkin P. V. Segregation effect on grain-boundary diffusion in thin metallic films // Thin Solid Films. 1996. Vol. 275. No. 1-2. pp. 144-147.
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TY - JOUR
DO - 10.1016/0040-6090(95)07028-1
UR - https://doi.org/10.1016/0040-6090(95)07028-1
TI - Segregation effect on grain-boundary diffusion in thin metallic films
T2 - Thin Solid Films
AU - ALESHIN, A. N.
AU - Bokstein, B.S
AU - Egorov, V.K.
AU - Kurkin, P V
PY - 1996
DA - 1996/04/01
PB - Elsevier
SP - 144-147
IS - 1-2
VL - 275
SN - 0040-6090
SN - 1879-2731
ER -
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@article{1996_ALESHIN,
author = {A. N. ALESHIN and B.S Bokstein and V.K. Egorov and P V Kurkin},
title = {Segregation effect on grain-boundary diffusion in thin metallic films},
journal = {Thin Solid Films},
year = {1996},
volume = {275},
publisher = {Elsevier},
month = {apr},
url = {https://doi.org/10.1016/0040-6090(95)07028-1},
number = {1-2},
pages = {144--147},
doi = {10.1016/0040-6090(95)07028-1}
}
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MLA
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ALESHIN, A. N., et al. “Segregation effect on grain-boundary diffusion in thin metallic films.” Thin Solid Films, vol. 275, no. 1-2, Apr. 1996, pp. 144-147. https://doi.org/10.1016/0040-6090(95)07028-1.
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