Exploring different inelastic projection mechanisms for electron tomography
Тип публикации: Journal Article
Дата публикации: 2011-07-01
scimago Q2
wos Q3
БС1
SJR: 0.716
CiteScore: 4.1
Impact factor: 2.0
ISSN: 03043991, 18792723
PubMed ID:
21864766
Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation
Краткое описание
Several different projection mechanisms that all make use of inelastically scattered electrons are used for electron tomography. The advantages and the disadvantages of these methods are compared to HAADF-STEM tomography, which is considered as the standard electron tomography technique in materials science. The different inelastic setups used are energy filtered transmission electron microscopy (EFTEM), thickness mapping based on the log-ratio method and bulk plasmon mapping. We present a comparison that can be used to select the best inelastic signal for tomography, depending on different parameters such as the beam stability and nature of the sample. The appropriate signal will obviously also depend on the exact information which is requested.
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Goris B. et al. Exploring different inelastic projection mechanisms for electron tomography // Ultramicroscopy. 2011. Vol. 111. No. 8. pp. 1262-1267.
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Goris B., van den Broek W., Van Tendeloo G., Bals S., Verbeeck J. Exploring different inelastic projection mechanisms for electron tomography // Ultramicroscopy. 2011. Vol. 111. No. 8. pp. 1262-1267.
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TY - JOUR
DO - 10.1016/j.ultramic.2011.02.007
UR - https://doi.org/10.1016/j.ultramic.2011.02.007
TI - Exploring different inelastic projection mechanisms for electron tomography
T2 - Ultramicroscopy
AU - Goris, B.
AU - van den Broek, W.
AU - Van Tendeloo, G.
AU - Bals, Sara
AU - Verbeeck, J.
PY - 2011
DA - 2011/07/01
PB - Elsevier
SP - 1262-1267
IS - 8
VL - 111
PMID - 21864766
SN - 0304-3991
SN - 1879-2723
ER -
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@article{2011_Goris,
author = {B. Goris and W. van den Broek and G. Van Tendeloo and Sara Bals and J. Verbeeck},
title = {Exploring different inelastic projection mechanisms for electron tomography},
journal = {Ultramicroscopy},
year = {2011},
volume = {111},
publisher = {Elsevier},
month = {jul},
url = {https://doi.org/10.1016/j.ultramic.2011.02.007},
number = {8},
pages = {1262--1267},
doi = {10.1016/j.ultramic.2011.02.007}
}
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MLA
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Goris, B., et al. “Exploring different inelastic projection mechanisms for electron tomography.” Ultramicroscopy, vol. 111, no. 8, Jul. 2011, pp. 1262-1267. https://doi.org/10.1016/j.ultramic.2011.02.007.