Open Access
Secondary Electron Attachment-Induced Radiation Damage to Genetic Materials
Publication type: Journal Article
Publication date: 2023-03-15
scimago Q1
wos Q2
SJR: 0.773
CiteScore: 7.1
Impact factor: 4.3
ISSN: 24701343
PubMed ID:
37008102
General Chemistry
General Chemical Engineering
Abstract
Reactions of radiation-produced secondary electrons (SEs) with biomacromolecules (e.g., DNA) are considered one of the primary causes of radiation-induced cell death. In this Review, we summarize the latest developments in the modeling of SE attachment-induced radiation damage. The initial attachment of electrons to genetic materials has traditionally been attributed to the temporary bound or resonance states. Recent studies have, however, indicated an alternative possibility with two steps. First, the dipole-bound states act as a doorway for electron capture. Subsequently, the electron gets transferred to the valence-bound state, in which the electron is localized on the nucleobase. The transfer from the dipole-bound to valence-bound state happens through a mixing of electronic and nuclear degrees of freedom. In the presence of aqueous media, the water-bound states act as the doorway state, which is similar to that of the presolvated electron. Electron transfer from the initial doorway state to the nucleobase-bound state in the presence of bulk aqueous media happens on an ultrafast time scale, and it can account for the decrease in DNA strand breaks in aqueous environments. Analyses of the theoretically obtained results along with experimental data have also been discussed.
Found
Nothing found, try to update filter.
Found
Nothing found, try to update filter.
Top-30
Journals
|
1
2
3
4
5
6
|
|
|
Journal of Chemical Physics
6 publications, 18.18%
|
|
|
Physical Chemistry Chemical Physics
4 publications, 12.12%
|
|
|
Molecules
3 publications, 9.09%
|
|
|
Journal of Physical Chemistry Letters
2 publications, 6.06%
|
|
|
Journal of Physical Chemistry B
2 publications, 6.06%
|
|
|
European Physical Journal D
2 publications, 6.06%
|
|
|
Journal of the American Chemical Society
1 publication, 3.03%
|
|
|
ACS Nano
1 publication, 3.03%
|
|
|
DNA
1 publication, 3.03%
|
|
|
Science
1 publication, 3.03%
|
|
|
ACS Omega
1 publication, 3.03%
|
|
|
Wiley Interdisciplinary Reviews: Nanomedicine and Nanobiotechnology
1 publication, 3.03%
|
|
|
ChemPhysChem
1 publication, 3.03%
|
|
|
International Journal of Molecular Sciences
1 publication, 3.03%
|
|
|
Chemistry - A European Journal
1 publication, 3.03%
|
|
|
Computational and Theoretical Chemistry
1 publication, 3.03%
|
|
|
Ultramicroscopy
1 publication, 3.03%
|
|
|
Journal of Physical Chemistry A
1 publication, 3.03%
|
|
|
Journal of Chemical Sciences
1 publication, 3.03%
|
|
|
1
2
3
4
5
6
|
Publishers
|
1
2
3
4
5
6
7
8
|
|
|
American Chemical Society (ACS)
8 publications, 24.24%
|
|
|
AIP Publishing
6 publications, 18.18%
|
|
|
MDPI
5 publications, 15.15%
|
|
|
Royal Society of Chemistry (RSC)
4 publications, 12.12%
|
|
|
Wiley
3 publications, 9.09%
|
|
|
Springer Nature
3 publications, 9.09%
|
|
|
Elsevier
2 publications, 6.06%
|
|
|
American Association for the Advancement of Science (AAAS)
1 publication, 3.03%
|
|
|
Cold Spring Harbor Laboratory
1 publication, 3.03%
|
|
|
1
2
3
4
5
6
7
8
|
- We do not take into account publications without a DOI.
- Statistics recalculated weekly.
Are you a researcher?
Create a profile to get free access to personal recommendations for colleagues and new articles.
Metrics
33
Total citations:
33
Citations from 2024:
29
(87.87%)
Cite this
GOST |
RIS |
BibTex |
MLA
Cite this
GOST
Copy
Narayanan S J J. et al. Secondary Electron Attachment-Induced Radiation Damage to Genetic Materials // ACS Omega. 2023. Vol. 8. No. 12. pp. 10669-10689.
GOST all authors (up to 50)
Copy
Narayanan S J J., Tripathi D., Verma P., Adhikary A., Dutta A. K. Secondary Electron Attachment-Induced Radiation Damage to Genetic Materials // ACS Omega. 2023. Vol. 8. No. 12. pp. 10669-10689.
Cite this
RIS
Copy
TY - JOUR
DO - 10.1021/acsomega.2c06776
UR - https://pubs.acs.org/doi/10.1021/acsomega.2c06776
TI - Secondary Electron Attachment-Induced Radiation Damage to Genetic Materials
T2 - ACS Omega
AU - Narayanan S J, Jishnu
AU - Tripathi, Divya
AU - Verma, Pooja
AU - Adhikary, Amitava
AU - Dutta, Achintya K.
PY - 2023
DA - 2023/03/15
PB - American Chemical Society (ACS)
SP - 10669-10689
IS - 12
VL - 8
PMID - 37008102
SN - 2470-1343
ER -
Cite this
BibTex (up to 50 authors)
Copy
@article{2023_Narayanan S J,
author = {Jishnu Narayanan S J and Divya Tripathi and Pooja Verma and Amitava Adhikary and Achintya K. Dutta},
title = {Secondary Electron Attachment-Induced Radiation Damage to Genetic Materials},
journal = {ACS Omega},
year = {2023},
volume = {8},
publisher = {American Chemical Society (ACS)},
month = {mar},
url = {https://pubs.acs.org/doi/10.1021/acsomega.2c06776},
number = {12},
pages = {10669--10689},
doi = {10.1021/acsomega.2c06776}
}
Cite this
MLA
Copy
Narayanan S. J., Jishnu, et al. “Secondary Electron Attachment-Induced Radiation Damage to Genetic Materials.” ACS Omega, vol. 8, no. 12, Mar. 2023, pp. 10669-10689. https://pubs.acs.org/doi/10.1021/acsomega.2c06776.