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volume 8 issue 12 pages 10669-10689

Secondary Electron Attachment-Induced Radiation Damage to Genetic Materials

Publication typeJournal Article
Publication date2023-03-15
scimago Q1
wos Q2
SJR0.773
CiteScore7.1
Impact factor4.3
ISSN24701343
General Chemistry
General Chemical Engineering
Abstract
Reactions of radiation-produced secondary electrons (SEs) with biomacromolecules (e.g., DNA) are considered one of the primary causes of radiation-induced cell death. In this Review, we summarize the latest developments in the modeling of SE attachment-induced radiation damage. The initial attachment of electrons to genetic materials has traditionally been attributed to the temporary bound or resonance states. Recent studies have, however, indicated an alternative possibility with two steps. First, the dipole-bound states act as a doorway for electron capture. Subsequently, the electron gets transferred to the valence-bound state, in which the electron is localized on the nucleobase. The transfer from the dipole-bound to valence-bound state happens through a mixing of electronic and nuclear degrees of freedom. In the presence of aqueous media, the water-bound states act as the doorway state, which is similar to that of the presolvated electron. Electron transfer from the initial doorway state to the nucleobase-bound state in the presence of bulk aqueous media happens on an ultrafast time scale, and it can account for the decrease in DNA strand breaks in aqueous environments. Analyses of the theoretically obtained results along with experimental data have also been discussed.
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GOST |
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GOST Copy
Narayanan S J J. et al. Secondary Electron Attachment-Induced Radiation Damage to Genetic Materials // ACS Omega. 2023. Vol. 8. No. 12. pp. 10669-10689.
GOST all authors (up to 50) Copy
Narayanan S J J., Tripathi D., Verma P., Adhikary A., Dutta A. K. Secondary Electron Attachment-Induced Radiation Damage to Genetic Materials // ACS Omega. 2023. Vol. 8. No. 12. pp. 10669-10689.
RIS |
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RIS Copy
TY - JOUR
DO - 10.1021/acsomega.2c06776
UR - https://pubs.acs.org/doi/10.1021/acsomega.2c06776
TI - Secondary Electron Attachment-Induced Radiation Damage to Genetic Materials
T2 - ACS Omega
AU - Narayanan S J, Jishnu
AU - Tripathi, Divya
AU - Verma, Pooja
AU - Adhikary, Amitava
AU - Dutta, Achintya K.
PY - 2023
DA - 2023/03/15
PB - American Chemical Society (ACS)
SP - 10669-10689
IS - 12
VL - 8
PMID - 37008102
SN - 2470-1343
ER -
BibTex |
Cite this
BibTex (up to 50 authors) Copy
@article{2023_Narayanan S J,
author = {Jishnu Narayanan S J and Divya Tripathi and Pooja Verma and Amitava Adhikary and Achintya K. Dutta},
title = {Secondary Electron Attachment-Induced Radiation Damage to Genetic Materials},
journal = {ACS Omega},
year = {2023},
volume = {8},
publisher = {American Chemical Society (ACS)},
month = {mar},
url = {https://pubs.acs.org/doi/10.1021/acsomega.2c06776},
number = {12},
pages = {10669--10689},
doi = {10.1021/acsomega.2c06776}
}
MLA
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MLA Copy
Narayanan S. J., Jishnu, et al. “Secondary Electron Attachment-Induced Radiation Damage to Genetic Materials.” ACS Omega, vol. 8, no. 12, Mar. 2023, pp. 10669-10689. https://pubs.acs.org/doi/10.1021/acsomega.2c06776.