How Bulk Sensitive is Hard X-ray Photoelectron Spectroscopy: Accounting for the Cathode–Electrolyte Interface when Addressing Oxygen Redox
Hyeseung Chung
2
,
Mateusz Zuba
3
,
Jatinkumar Rana
3
,
Yixuan Li
2
,
Nicholas Faenza
4
,
Nathalie Pereira
4
,
B.D McCloskey
5, 6
,
Fanny Rodolakis
7
,
W.Q. Yang
8
,
Glenn G Amatucci
4
,
Ying Meng
2
,
Tien-Lin Lee
9
,
Louis F.J. Piper
1, 3
3
Publication type: Journal Article
Publication date: 2020-02-26
scimago Q1
wos Q1
SJR: 1.394
CiteScore: 8.7
Impact factor: 4.6
ISSN: 19487185
PubMed ID:
32101006
Physical and Theoretical Chemistry
General Materials Science
Abstract
Sensitivity to the "bulk" oxygen core orbital makes hard X-ray photoelectron spectroscopy (HAXPES) an appealing technique for studying oxygen redox candidates. Various studies have reported an additional O 1s peak (530-531 eV) at high voltages, which has been considered a direct signature of the bulk oxygen redox process. Here, we find the emergence of a 530.4 eV O 1s HAXPES peak for three model cathodes-Li2MnO3, Li-rich NMC, and NMC 442-that shows no clear link to oxygen redox. Instead, the 530.4 eV peak for these three systems is attributed to transition metal reduction and electrolyte decomposition in the near-surface region. Claims of oxygen redox relying on photoelectron spectroscopy must explicitly account for the surface sensitivity of this technique and the extent of the cathode degradation layer.
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44
Total citations:
44
Citations from 2024:
10
(22%)
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MLA
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GOST
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Lebens-Higgins Z. W. et al. How Bulk Sensitive is Hard X-ray Photoelectron Spectroscopy: Accounting for the Cathode–Electrolyte Interface when Addressing Oxygen Redox // Journal of Physical Chemistry Letters. 2020. Vol. 11. No. 6. pp. 2106-2112.
GOST all authors (up to 50)
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Lebens-Higgins Z. W., Chung H., Zuba M., Rana J., Li Y., Faenza N., Pereira N., McCloskey B., Rodolakis F., Yang W., Whittingham M. S., Amatucci G. G., Meng Y., Lee T., Piper L. F. How Bulk Sensitive is Hard X-ray Photoelectron Spectroscopy: Accounting for the Cathode–Electrolyte Interface when Addressing Oxygen Redox // Journal of Physical Chemistry Letters. 2020. Vol. 11. No. 6. pp. 2106-2112.
Cite this
RIS
Copy
TY - JOUR
DO - 10.1021/acs.jpclett.0c00229
UR - https://doi.org/10.1021/acs.jpclett.0c00229
TI - How Bulk Sensitive is Hard X-ray Photoelectron Spectroscopy: Accounting for the Cathode–Electrolyte Interface when Addressing Oxygen Redox
T2 - Journal of Physical Chemistry Letters
AU - Lebens-Higgins, Zachary W.
AU - Chung, Hyeseung
AU - Zuba, Mateusz
AU - Rana, Jatinkumar
AU - Li, Yixuan
AU - Faenza, Nicholas
AU - Pereira, Nathalie
AU - McCloskey, B.D
AU - Rodolakis, Fanny
AU - Yang, W.Q.
AU - Whittingham, M. Stanley
AU - Amatucci, Glenn G
AU - Meng, Ying
AU - Lee, Tien-Lin
AU - Piper, Louis F.J.
PY - 2020
DA - 2020/02/26
PB - American Chemical Society (ACS)
SP - 2106-2112
IS - 6
VL - 11
PMID - 32101006
SN - 1948-7185
ER -
Cite this
BibTex (up to 50 authors)
Copy
@article{2020_Lebens-Higgins,
author = {Zachary W. Lebens-Higgins and Hyeseung Chung and Mateusz Zuba and Jatinkumar Rana and Yixuan Li and Nicholas Faenza and Nathalie Pereira and B.D McCloskey and Fanny Rodolakis and W.Q. Yang and M. Stanley Whittingham and Glenn G Amatucci and Ying Meng and Tien-Lin Lee and Louis F.J. Piper},
title = {How Bulk Sensitive is Hard X-ray Photoelectron Spectroscopy: Accounting for the Cathode–Electrolyte Interface when Addressing Oxygen Redox},
journal = {Journal of Physical Chemistry Letters},
year = {2020},
volume = {11},
publisher = {American Chemical Society (ACS)},
month = {feb},
url = {https://doi.org/10.1021/acs.jpclett.0c00229},
number = {6},
pages = {2106--2112},
doi = {10.1021/acs.jpclett.0c00229}
}
Cite this
MLA
Copy
Lebens-Higgins, Zachary W., et al. “How Bulk Sensitive is Hard X-ray Photoelectron Spectroscopy: Accounting for the Cathode–Electrolyte Interface when Addressing Oxygen Redox.” Journal of Physical Chemistry Letters, vol. 11, no. 6, Feb. 2020, pp. 2106-2112. https://doi.org/10.1021/acs.jpclett.0c00229.