том 11 издание 11 страницы 4286-4291

Direct Observation of the Exciton Self-Trapping Process in CsCu2I3 Thin Films

Тип публикацииJournal Article
Дата публикации2020-05-14
scimago Q1
wos Q1
БС1
SJR1.394
CiteScore8.7
Impact factor4.6
ISSN19487185
Physical and Theoretical Chemistry
General Materials Science
Краткое описание
Low-dimensional copper halides, such as CsCu2I3, have emerged as promising LED materials featuring strongly Stokes-shifted photoluminescence with high quantum yield. Previous calculations suggest an exciton self-trapping mechanism; however, direct experimental evidence for this process is still lacking. Here, we present femtosecond UV-vis transient absorption experiments of CsCu2I3 thin films. The films were analyzed by SEM, XRD, and 133Cs/63Cu NMR for crystallinity and defects. Unique spectral dynamics is observed. The band gap absorption exhibits a characteristic double-peak structure arising from the 130 meV spin-orbit splitting of the copper d electrons. Emission at the direct band gap disappears because of the formation of the lowest-energy self-trapped exciton state. We determined the time constant of 12 ps for the trapping process of thermally relaxed free excitons, with an energy barrier of at least 60 meV. The data are successfully modeled by global kinetic analysis, providing also accurate time constants for charge carrier cooling processes.
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Kentsch R. et al. Direct Observation of the Exciton Self-Trapping Process in CsCu2I3 Thin Films // Journal of Physical Chemistry Letters. 2020. Vol. 11. No. 11. pp. 4286-4291.
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Kentsch R., Morgenroth M., Scholz M., Xu K., Schmedt auf der Günne J., Lenzer T., Oum K. Direct Observation of the Exciton Self-Trapping Process in CsCu2I3 Thin Films // Journal of Physical Chemistry Letters. 2020. Vol. 11. No. 11. pp. 4286-4291.
RIS |
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TY - JOUR
DO - 10.1021/acs.jpclett.0c01130
UR - https://doi.org/10.1021/acs.jpclett.0c01130
TI - Direct Observation of the Exciton Self-Trapping Process in CsCu2I3 Thin Films
T2 - Journal of Physical Chemistry Letters
AU - Kentsch, Robin
AU - Morgenroth, Marius
AU - Scholz, Mirko
AU - Xu, Ke
AU - Schmedt auf der Günne, Jörn
AU - Lenzer, Thomas
AU - Oum, Kawon
PY - 2020
DA - 2020/05/14
PB - American Chemical Society (ACS)
SP - 4286-4291
IS - 11
VL - 11
PMID - 32407630
SN - 1948-7185
ER -
BibTex |
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@article{2020_Kentsch,
author = {Robin Kentsch and Marius Morgenroth and Mirko Scholz and Ke Xu and Jörn Schmedt auf der Günne and Thomas Lenzer and Kawon Oum},
title = {Direct Observation of the Exciton Self-Trapping Process in CsCu2I3 Thin Films},
journal = {Journal of Physical Chemistry Letters},
year = {2020},
volume = {11},
publisher = {American Chemical Society (ACS)},
month = {may},
url = {https://doi.org/10.1021/acs.jpclett.0c01130},
number = {11},
pages = {4286--4291},
doi = {10.1021/acs.jpclett.0c01130}
}
MLA
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Kentsch, Robin, et al. “Direct Observation of the Exciton Self-Trapping Process in CsCu2I3 Thin Films.” Journal of Physical Chemistry Letters, vol. 11, no. 11, May. 2020, pp. 4286-4291. https://doi.org/10.1021/acs.jpclett.0c01130.