Crystallography-Derived Young's Modulus and Tensile Strength of AlN Nanowires as Revealed by in Situ Transmission Electron Microscopy
TY - JOUR
DO - 10.1021/acs.nanolett.9b00263
UR - http://dx.doi.org/10.1021/acs.nanolett.9b00263
TI - Crystallography-Derived Young’s Modulus and Tensile Strength of AlN Nanowires as Revealed by in Situ Transmission Electron Microscopy
T2 - Nano Letters
AU - Firestein, Konstantin L.
AU - Kvashnin, Dmitry G.
AU - Fernando, Joseph F.S.
AU - Zhang, Chao
AU - Siriwardena, Dumindu P.
AU - Sorokin, Pavel B.
AU - Golberg, Dmitri V.
PY - 2019
DA - 2019/02/21
PB - American Chemical Society (ACS)
SP - 2084-2091
IS - 3
VL - 19
SN - 1530-6984
SN - 1530-6992
ER -
@article{2019,
doi = {10.1021/acs.nanolett.9b00263},
url = {https://doi.org/10.1021%2Facs.nanolett.9b00263},
year = 2019,
month = {feb},
publisher = {American Chemical Society ({ACS})},
volume = {19},
number = {3},
pages = {2084--2091},
author = {Konstantin L. Firestein and Dmitry G. Kvashnin and Joseph F.S. Fernando and Chao Zhang and Dumindu P. Siriwardena and Pavel B. Sorokin and Dmitri V. Golberg},
title = {Crystallography-Derived Young's Modulus and Tensile Strength of {AlN} Nanowires as Revealed by in Situ Transmission Electron Microscopy}
}