ACS applied materials & interfaces, volume 15, issue 25, pages 30052-30059
Assessment of the Degradation Mechanisms of Cu Electrodes during the CO2 Reduction Reaction
Rik V Mom
1
,
Luis Ernesto Sandoval Diaz
1
,
Dunfeng Gao
2, 3
,
Cheng-Hao Chuang
4
,
Emilia A. Carbonio
1, 5
,
Travis H. Jones
1, 6
,
Rosa Arrigo
7
,
Danail Ivanov
1
,
Michael Hävecker
1, 8
,
Beatriz Roldan
2
,
Robert Schlögl
1, 8
,
Thomas Lunkenbein
1
,
Axel Knop-Gericke
1, 8
,
Juan J. Velasco-Velez
1, 8, 9
5
Helmholtz-Zemtrum Berlin für Materialien und Energie, 14109 Berlin, Germany
|
6
7
School of Sciences, University of Salford, Environment and Life, Cockcroft Building, M5 4WT Manchester, U.K
|
Publication type: Journal Article
Publication date: 2023-06-15
Journal:
ACS applied materials & interfaces
Quartile SCImago
Q1
Quartile WOS
Q1
Impact factor: 9.5
ISSN: 19448244, 19448252
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Mom R. V. et al. Assessment of the Degradation Mechanisms of Cu Electrodes during the CO2 Reduction Reaction // ACS applied materials & interfaces. 2023. Vol. 15. No. 25. pp. 30052-30059.
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Mom R. V., Sandoval Diaz L. E., Gao D., Chuang C., Carbonio E. A., Jones T. H., Arrigo R., Ivanov D., Hävecker M., Roldan B., Schlögl R., Lunkenbein T., Knop-Gericke A., Velasco-Velez J. J. Assessment of the Degradation Mechanisms of Cu Electrodes during the CO2 Reduction Reaction // ACS applied materials & interfaces. 2023. Vol. 15. No. 25. pp. 30052-30059.
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TY - JOUR
DO - 10.1021/acsami.2c23007
UR - https://doi.org/10.1021/acsami.2c23007
TI - Assessment of the Degradation Mechanisms of Cu Electrodes during the CO2 Reduction Reaction
T2 - ACS applied materials & interfaces
AU - Mom, Rik V
AU - Sandoval Diaz, Luis Ernesto
AU - Gao, Dunfeng
AU - Chuang, Cheng-Hao
AU - Carbonio, Emilia A.
AU - Jones, Travis H.
AU - Arrigo, Rosa
AU - Ivanov, Danail
AU - Hävecker, Michael
AU - Roldan, Beatriz
AU - Schlögl, Robert
AU - Lunkenbein, Thomas
AU - Knop-Gericke, Axel
AU - Velasco-Velez, Juan J.
PY - 2023
DA - 2023/06/15
PB - American Chemical Society (ACS)
SP - 30052-30059
IS - 25
VL - 15
SN - 1944-8244
SN - 1944-8252
ER -
Cite this
BibTex
Copy
@article{2023_Mom,
author = {Rik V Mom and Luis Ernesto Sandoval Diaz and Dunfeng Gao and Cheng-Hao Chuang and Emilia A. Carbonio and Travis H. Jones and Rosa Arrigo and Danail Ivanov and Michael Hävecker and Beatriz Roldan and Robert Schlögl and Thomas Lunkenbein and Axel Knop-Gericke and Juan J. Velasco-Velez},
title = {Assessment of the Degradation Mechanisms of Cu Electrodes during the CO2 Reduction Reaction},
journal = {ACS applied materials & interfaces},
year = {2023},
volume = {15},
publisher = {American Chemical Society (ACS)},
month = {jun},
url = {https://doi.org/10.1021/acsami.2c23007},
number = {25},
pages = {30052--30059},
doi = {10.1021/acsami.2c23007}
}
Cite this
MLA
Copy
Mom, Rik V., et al. “Assessment of the Degradation Mechanisms of Cu Electrodes during the CO2 Reduction Reaction.” ACS applied materials & interfaces, vol. 15, no. 25, Jun. 2023, pp. 30052-30059. https://doi.org/10.1021/acsami.2c23007.