том 114 издание 11 страницы 4237-4247

Electrochemistry and Langmuir trough studies of fullerene C60 and C70 films

Тип публикацииJournal Article
Дата публикации1992-05-01
SCImago Q1
Tоп 10% SCImago
WOS Q1
БС1
SJR5.491
CiteScore22
Impact factor16.6
ISSN00027863, 15205126
General Chemistry
Catalysis
Biochemistry
Colloid and Surface Chemistry
Краткое описание
Thin films of the fullerenes C{sub 60} and C{sub 70}, formed by solution casting, were studied by cyclic voltammetry (CV) in MeCN solutions containing quaternary ammonium or alkali-metal salts as supporting electrolytes. The film shows four CV reduction waves and one oxidation wave. The CV behavior for the first reduction, coulometrically equivalent to a one-electron reduction, indicates a large structural reorganization of the film with intercalation of the supporting electrolyte cation and a small amount of dissolution. Upon oxidation of the reduced form, the structure rearranges to form the parent. Similar effects occur for the second reduction/reoxidation process. The size of the cations affects the nature of these CV waves. Scanning electrochemical microscopy (SECM) of the C{sub 60} films indicates that neither the C{sub 60} film nor the completely reduced, C{sub 60}{sup -}, form is a good electronic conductor, while a partially reduced film displays enhanced conductivity. Langmuir trough studies of C{sub 60} and C{sub 70} show the preparation of highly incompressible monolayer and multilayer films at the air/water interface. Mixed films of the fullerenes with the surfactant arachidic acid can also be prepared. 42 refs., 18 figs., 1 tab.
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ГОСТ |
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Jehoulet C. et al. Electrochemistry and Langmuir trough studies of fullerene C60 and C70 films // Journal of the American Chemical Society. 1992. Vol. 114. No. 11. pp. 4237-4247.
ГОСТ со всеми авторами (до 50) Скопировать
Jehoulet C., Obeng Y. S., Kim Y., Zhou F. Electrochemistry and Langmuir trough studies of fullerene C60 and C70 films // Journal of the American Chemical Society. 1992. Vol. 114. No. 11. pp. 4237-4247.
RIS |
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TY - JOUR
DO - 10.1021/ja00037a030
UR - https://doi.org/10.1021/ja00037a030
TI - Electrochemistry and Langmuir trough studies of fullerene C60 and C70 films
T2 - Journal of the American Chemical Society
AU - Jehoulet, Christophe
AU - Obeng, Yaw S.
AU - Kim, Yeon-Taik
AU - Zhou, Feimeng
PY - 1992
DA - 1992/05/01
PB - American Chemical Society (ACS)
SP - 4237-4247
IS - 11
VL - 114
SN - 0002-7863
SN - 1520-5126
ER -
BibTex |
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BibTex (до 50 авторов) Скопировать
@article{1992_Jehoulet,
author = {Christophe Jehoulet and Yaw S. Obeng and Yeon-Taik Kim and Feimeng Zhou},
title = {Electrochemistry and Langmuir trough studies of fullerene C60 and C70 films},
journal = {Journal of the American Chemical Society},
year = {1992},
volume = {114},
publisher = {American Chemical Society (ACS)},
month = {may},
url = {https://doi.org/10.1021/ja00037a030},
number = {11},
pages = {4237--4247},
doi = {10.1021/ja00037a030}
}
MLA
Цитировать
Jehoulet, Christophe, et al. “Electrochemistry and Langmuir trough studies of fullerene C60 and C70 films.” Journal of the American Chemical Society, vol. 114, no. 11, May. 1992, pp. 4237-4247. https://doi.org/10.1021/ja00037a030.
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