Slow Surface Charge Trapping Kinetics on Irradiated TiO2
Тип публикации: Journal Article
Дата публикации: 2002-02-20
SCImago Q1
WOS Q2
БС2
SJR: 0.785
CiteScore: 5
Impact factor: 3.2
ISSN: 15206106, 15205207, 10895647
Materials Chemistry
Surfaces, Coatings and Films
Physical and Theoretical Chemistry
Краткое описание
Free and trapped charge carriers in polycrystalline TiO2 following band gap irradiation are characterized by diffuse reflectance IR spectroscopy (DRIFTS). A spectrum-wide absorption signal proportional to λ1.7 (λ = wavelength/μm) indicates the presence of free conduction band electrons coupled with acoustic phonons in the lattice. Free electrons appear to decay according to saturation kinetics. The fitted parameters indicate a limited number of trapping states. The concentration of these states appears to be diminished by sequential UV treatments. The free carrier decay lifetime is lengthened as the samples are dehydrated, which suggests an excited-state relaxation event during electron trapping. Photogenerated free electrons are comparable to conduction band electrons injected from surface-bound chromophores, and the lifetime of these electrons can be extended across several orders of magnitude. A broad IR absorption peak centered at 3380 cm-1 is attributed to an electronic transition from an occupied su...
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Szczepankiewicz S. H., Moss J. A., Hoffmann M. P. Slow Surface Charge Trapping Kinetics on Irradiated TiO2 // Journal of Physical Chemistry B. 2002. Vol. 106. No. 11. pp. 2922-2927.
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Szczepankiewicz S. H., Moss J. A., Hoffmann M. P. Slow Surface Charge Trapping Kinetics on Irradiated TiO2 // Journal of Physical Chemistry B. 2002. Vol. 106. No. 11. pp. 2922-2927.
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TY - JOUR
DO - 10.1021/jp004244h
UR - https://doi.org/10.1021/jp004244h
TI - Slow Surface Charge Trapping Kinetics on Irradiated TiO2
T2 - Journal of Physical Chemistry B
AU - Szczepankiewicz, Steven H
AU - Moss, John A
AU - Hoffmann, Michael P.
PY - 2002
DA - 2002/02/20
PB - American Chemical Society (ACS)
SP - 2922-2927
IS - 11
VL - 106
SN - 1520-6106
SN - 1520-5207
SN - 1089-5647
ER -
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@article{2002_Szczepankiewicz,
author = {Steven H Szczepankiewicz and John A Moss and Michael P. Hoffmann},
title = {Slow Surface Charge Trapping Kinetics on Irradiated TiO2},
journal = {Journal of Physical Chemistry B},
year = {2002},
volume = {106},
publisher = {American Chemical Society (ACS)},
month = {feb},
url = {https://doi.org/10.1021/jp004244h},
number = {11},
pages = {2922--2927},
doi = {10.1021/jp004244h}
}
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MLA
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Szczepankiewicz, Steven H., et al. “Slow Surface Charge Trapping Kinetics on Irradiated TiO2.” Journal of Physical Chemistry B, vol. 106, no. 11, Feb. 2002, pp. 2922-2927. https://doi.org/10.1021/jp004244h.
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