High resolution mapping of surface reduction in ceria nanoparticles
Stuart Turner
1
,
Sorin Lazar
2, 3
,
Bert Freitag
2
,
Ricardo Egoavil
1
,
J. Verbeeck
1
,
Stijn Put
4
,
Yvan Strauven
4
,
Gustaaf Van Tendeloo
1
2
FEI Company, Europe NanoPort, Achtseweg Noord 5, Eindhoven, The Netherlands
|
4
Umicore Group R&D, Kasteelstraat 7, Olen, Belgium
|
Publication type: Journal Article
Publication date: 2011-06-30
scimago Q1
wos Q1
SJR: 1.245
CiteScore: 9.9
Impact factor: 5.1
ISSN: 20403364, 20403372
PubMed ID:
21720618
General Materials Science
Abstract
Surface reduction of ceria nano octahedra with predominant {111} and {100} type surfaces is studied using a combination of aberration-corrected Transmission Electron Microscopy (TEM) and spatially resolved electron energy-loss spectroscopy (EELS) at high energy resolution and atomic spatial resolution. The valency of cerium ions at the surface of the nanoparticles is mapped using the fine structure of the Ce M(4,5) edge as a fingerprint. The valency of the surface cerium ions is found to change from 4+ to 3+ owing to oxygen deficiency (vacancies) close to the surface. The thickness of this Ce(3+) shell is measured using atomic-resolution Scanning Transmission Electron Microscopy (STEM)-EELS mapping over a {111} surface (the predominant facet for this ceria morphology), {111} type surface island steps and {100} terminating planes. For the {111} facets and for {111} surface islands, the reduction shell is found to extend over a single fully reduced surface plane and 1-2 underlying mixed valency planes. For the {100} facets the reduction shell extends over a larger area of 5-6 oxygen vacancy-rich planes. This finding provides a plausible explanation for the higher catalytic activity of the {100} surface facets in ceria.
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151
Total citations:
151
Citations from 2024:
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(13%)
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Turner S. et al. High resolution mapping of surface reduction in ceria nanoparticles // Nanoscale. 2011. Vol. 3. No. 8. pp. 3385-3390.
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Turner S., Lazar S., Freitag B., Egoavil R., Verbeeck J., Put S., Strauven Y., Van Tendeloo G. High resolution mapping of surface reduction in ceria nanoparticles // Nanoscale. 2011. Vol. 3. No. 8. pp. 3385-3390.
Cite this
RIS
Copy
TY - JOUR
DO - 10.1039/c1nr10510h
UR - https://doi.org/10.1039/c1nr10510h
TI - High resolution mapping of surface reduction in ceria nanoparticles
T2 - Nanoscale
AU - Turner, Stuart
AU - Lazar, Sorin
AU - Freitag, Bert
AU - Egoavil, Ricardo
AU - Verbeeck, J.
AU - Put, Stijn
AU - Strauven, Yvan
AU - Van Tendeloo, Gustaaf
PY - 2011
DA - 2011/06/30
PB - Royal Society of Chemistry (RSC)
SP - 3385-3390
IS - 8
VL - 3
PMID - 21720618
SN - 2040-3364
SN - 2040-3372
ER -
Cite this
BibTex (up to 50 authors)
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@article{2011_Turner,
author = {Stuart Turner and Sorin Lazar and Bert Freitag and Ricardo Egoavil and J. Verbeeck and Stijn Put and Yvan Strauven and Gustaaf Van Tendeloo},
title = {High resolution mapping of surface reduction in ceria nanoparticles},
journal = {Nanoscale},
year = {2011},
volume = {3},
publisher = {Royal Society of Chemistry (RSC)},
month = {jun},
url = {https://doi.org/10.1039/c1nr10510h},
number = {8},
pages = {3385--3390},
doi = {10.1039/c1nr10510h}
}
Cite this
MLA
Copy
Turner, Stuart, et al. “High resolution mapping of surface reduction in ceria nanoparticles.” Nanoscale, vol. 3, no. 8, Jun. 2011, pp. 3385-3390. https://doi.org/10.1039/c1nr10510h.