Growth and characterization of sputtered epitaxial γ′Fe4N and NbN films and bilayers using electron backscatter diffraction patterns and magnetometry
Publication type: Journal Article
Publication date: 2003-05-12
scimago Q1
wos Q2
SJR: 0.896
CiteScore: 6.1
Impact factor: 3.6
ISSN: 00036951, 10773118
Physics and Astronomy (miscellaneous)
Abstract
Epitaxial single-crystal ferromagnetic Fe4N films (γ′ phase of iron nitride), nonmagnetic NbN films, and NbN/Fe4N bilayers were grown on MgO(100) substrates by sputter deposition in N2 gas. Electron backscatter diffraction patterns were used to characterize the structural properties including the relative crystallographic orientation of the sputter deposited Fe4N and NbN films with respect to the substrate and each other. Superconducting quantum interference device magnetometry was used to study the in-plane uniaxial anisotropy and determine the directions of the easy axes in ferromagnetic Fe4N films.
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Total citations:
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Citations from 2024:
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Loloee R., Nikolaev K. R., Pratt W. B. Growth and characterization of sputtered epitaxial γ′Fe4N and NbN films and bilayers using electron backscatter diffraction patterns and magnetometry // Applied Physics Letters. 2003. Vol. 82. No. 19. pp. 3281-3283.
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Loloee R., Nikolaev K. R., Pratt W. B. Growth and characterization of sputtered epitaxial γ′Fe4N and NbN films and bilayers using electron backscatter diffraction patterns and magnetometry // Applied Physics Letters. 2003. Vol. 82. No. 19. pp. 3281-3283.
Cite this
RIS
Copy
TY - JOUR
DO - 10.1063/1.1573356
UR - https://doi.org/10.1063/1.1573356
TI - Growth and characterization of sputtered epitaxial γ′Fe4N and NbN films and bilayers using electron backscatter diffraction patterns and magnetometry
T2 - Applied Physics Letters
AU - Loloee, R
AU - Nikolaev, K. R.
AU - Pratt, W B
PY - 2003
DA - 2003/05/12
PB - AIP Publishing
SP - 3281-3283
IS - 19
VL - 82
SN - 0003-6951
SN - 1077-3118
ER -
Cite this
BibTex (up to 50 authors)
Copy
@article{2003_Loloee,
author = {R Loloee and K. R. Nikolaev and W B Pratt},
title = {Growth and characterization of sputtered epitaxial γ′Fe4N and NbN films and bilayers using electron backscatter diffraction patterns and magnetometry},
journal = {Applied Physics Letters},
year = {2003},
volume = {82},
publisher = {AIP Publishing},
month = {may},
url = {https://doi.org/10.1063/1.1573356},
number = {19},
pages = {3281--3283},
doi = {10.1063/1.1573356}
}
Cite this
MLA
Copy
Loloee, R., et al. “Growth and characterization of sputtered epitaxial γ′Fe4N and NbN films and bilayers using electron backscatter diffraction patterns and magnetometry.” Applied Physics Letters, vol. 82, no. 19, May. 2003, pp. 3281-3283. https://doi.org/10.1063/1.1573356.