Journal of Applied Physics, volume 84, issue 12, pages 6686-6688

In0.5Ga0.5As quantum dot intermixing and evaporation in GaAs capping layer growth

Publication typeJournal Article
Publication date1998-12-15
scimago Q2
wos Q2
SJR0.649
CiteScore5.4
Impact factor2.7
ISSN00218979, 10897550
General Physics and Astronomy
Abstract

Our study of GaAs growth over self-assembled In0.5Ga0.5As quantum dots grown by metalorganic vapor-phase epitaxy showed that GaAs capping layer surface morphology at the onset strongly depended on temperature. Incompletely capped In0.5Ga0.5As islands were elongated toward [110], indicating anisotropy in intermixing. During higher-temperature growth interruption, islands show craters in quantum dot centers. Craters become hexagonal holes whose depth matches GaAs capping layer thickness. Postannealing photoluminescence spectra show no peak corresponding to overly large quantum dot radiation, indicating that growth interruption after capping layer formation at a certain thickness eliminates overly large quantum dots.

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