Molecular structure and carrier distributions at semiconductor/dielectric interfaces in organic field-effect transistors studied with sum frequency generation microscopy
Тип публикации: Journal Article
Дата публикации: 2009-12-14
scimago Q1
wos Q2
white level БС1
SJR: 0.896
CiteScore: 6.1
Impact factor: 3.6
ISSN: 00036951, 10773118
Physics and Astronomy (miscellaneous)
Краткое описание
Infrared-visible sum frequency generation (SFG) microscopy was applied to the observation of semiconductor/dielectric interfaces in organic field-effect transistors fabricated with pentacene films and polyvinyl phenol dielectric layers. SFG intensity at the interface was greatly increased by carrier injection. The large enhancement in SFG intensity enables us to observe clearly the vibrational spectra of molecules and the spatial distributions of charge density at the interface.
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ГОСТ
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Nakai I. F. et al. Molecular structure and carrier distributions at semiconductor/dielectric interfaces in organic field-effect transistors studied with sum frequency generation microscopy // Applied Physics Letters. 2009. Vol. 95. No. 24. p. 243304.
ГОСТ со всеми авторами (до 50)
Скопировать
Nakai I. F., Tachioka M., Ugawa A., UEDA T., Watanabe K., Matsumoto Y. Molecular structure and carrier distributions at semiconductor/dielectric interfaces in organic field-effect transistors studied with sum frequency generation microscopy // Applied Physics Letters. 2009. Vol. 95. No. 24. p. 243304.
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RIS
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TY - JOUR
DO - 10.1063/1.3275805
UR - https://doi.org/10.1063/1.3275805
TI - Molecular structure and carrier distributions at semiconductor/dielectric interfaces in organic field-effect transistors studied with sum frequency generation microscopy
T2 - Applied Physics Letters
AU - Nakai, Ikuyo F.
AU - Tachioka, Masaaki
AU - Ugawa, Akito
AU - UEDA, Tadashi
AU - Watanabe, Kazuya
AU - Matsumoto, Yoshiyasu
PY - 2009
DA - 2009/12/14
PB - AIP Publishing
SP - 243304
IS - 24
VL - 95
SN - 0003-6951
SN - 1077-3118
ER -
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BibTex (до 50 авторов)
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@article{2009_Nakai,
author = {Ikuyo F. Nakai and Masaaki Tachioka and Akito Ugawa and Tadashi UEDA and Kazuya Watanabe and Yoshiyasu Matsumoto},
title = {Molecular structure and carrier distributions at semiconductor/dielectric interfaces in organic field-effect transistors studied with sum frequency generation microscopy},
journal = {Applied Physics Letters},
year = {2009},
volume = {95},
publisher = {AIP Publishing},
month = {dec},
url = {https://doi.org/10.1063/1.3275805},
number = {24},
pages = {243304},
doi = {10.1063/1.3275805}
}
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MLA
Скопировать
Nakai, Ikuyo F., et al. “Molecular structure and carrier distributions at semiconductor/dielectric interfaces in organic field-effect transistors studied with sum frequency generation microscopy.” Applied Physics Letters, vol. 95, no. 24, Dec. 2009, p. 243304. https://doi.org/10.1063/1.3275805.
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