Application of low-temperature scanning electron microscopy to superconductors
Тип публикации: Journal Article
Дата публикации: 1980-05-01
scimago Q2
wos Q3
БС1
SJR: 0.580
CiteScore: 5.1
Impact factor: 2.5
ISSN: 00218979, 10897550
General Physics and Astronomy
Краткое описание
Scanning electron microscopy applied to specimens in close thermal contact with a liquid-helium bath can be used for a two-dimensional display of various sample responses arising from the localized excitation of the sample by the electron beam. As shown in recent experiments, the method becomes particularly interesting when applied to superconductors. A general response theory is outlined, and a detailed treatment is given for the special case of the thermal response associated with a strongly temperature-dependent electrical resistance of the sample.
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ГОСТ |
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ГОСТ
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Clem J. R., Huebener R. Application of low-temperature scanning electron microscopy to superconductors // Journal of Applied Physics. 1980. Vol. 51. No. 5. p. 2764.
ГОСТ со всеми авторами (до 50)
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Clem J. R., Huebener R. Application of low-temperature scanning electron microscopy to superconductors // Journal of Applied Physics. 1980. Vol. 51. No. 5. p. 2764.
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RIS
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TY - JOUR
DO - 10.1063/1.327939
UR - https://doi.org/10.1063/1.327939
TI - Application of low-temperature scanning electron microscopy to superconductors
T2 - Journal of Applied Physics
AU - Clem, John R.
AU - Huebener, R.P.
PY - 1980
DA - 1980/05/01
PB - AIP Publishing
SP - 2764
IS - 5
VL - 51
SN - 0021-8979
SN - 1089-7550
ER -
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BibTex (до 50 авторов)
Скопировать
@article{1980_Clem,
author = {John R. Clem and R.P. Huebener},
title = {Application of low-temperature scanning electron microscopy to superconductors},
journal = {Journal of Applied Physics},
year = {1980},
volume = {51},
publisher = {AIP Publishing},
month = {may},
url = {https://doi.org/10.1063/1.327939},
number = {5},
pages = {2764},
doi = {10.1063/1.327939}
}
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MLA
Скопировать
Clem, John R., et al. “Application of low-temperature scanning electron microscopy to superconductors.” Journal of Applied Physics, vol. 51, no. 5, May. 1980, p. 2764. https://doi.org/10.1063/1.327939.