Journal of Chemical Physics, volume 134, issue 9, pages 94706
False multiple exciton recombination and multiple exciton generation signals in semiconductor quantum dots arise from surface charge trapping
Publication type: Journal Article
Publication date: 2011-03-07
Journal:
Journal of Chemical Physics
Quartile SCImago
Q1
Quartile WOS
Q1
Impact factor: 4.4
ISSN: 00219606, 10897690
Physical and Theoretical Chemistry
General Physics and Astronomy
Abstract
Multiple exciton recombination (MER) and multiple exciton generation (MEG) are two of the main processes for assessing the usefulness of quantum dots (QDs) in photovoltaic devices. Recent experiments, however, have shown that a firm understanding of both processes is far from well established. By performing surface-dependent measurements on colloidal CdSe QDs, we find that surface-induced charge trapping processes lead to false MER and MEG signals resulting in an inaccurate measurement of these processes. Our results show that surface-induced processes create a significant contribution to the observed discrepancies in both MER and MEG experiments. Spectral signatures in the transient absorption signals reveal the physical origin of these false signals.
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2 publications, 1.16%
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2 publications, 1.16%
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2 publications, 1.16%
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2 publications, 1.16%
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2 publications, 1.16%
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1 publication, 0.58%
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1 publication, 0.58%
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1 publication, 0.58%
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Materials
1 publication, 0.58%
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Polymers
1 publication, 0.58%
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Citations by publishers
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American Chemical Society (ACS)
89 publications, 51.45%
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Royal Society of Chemistry (RSC)
21 publications, 12.14%
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Elsevier
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Springer Nature
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American Physical Society (APS)
8 publications, 4.62%
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4 publications, 2.31%
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IOP Publishing
2 publications, 1.16%
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SPIE
2 publications, 1.16%
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Beilstein-Institut
1 publication, 0.58%
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EDP Sciences
1 publication, 0.58%
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Materials Research Society
1 publication, 0.58%
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Taylor & Francis
1 publication, 0.58%
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IEEE
1 publication, 0.58%
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Autonomous Non-profit Organization Editorial Board of the journal Uspekhi Khimii
1 publication, 0.58%
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- We do not take into account publications without a DOI.
- Statistics recalculated only for publications connected to researchers, organizations and labs registered on the platform.
- Statistics recalculated weekly.
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Tyagi P., Kambhampati P. False multiple exciton recombination and multiple exciton generation signals in semiconductor quantum dots arise from surface charge trapping // Journal of Chemical Physics. 2011. Vol. 134. No. 9. p. 94706.
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Tyagi P., Kambhampati P. False multiple exciton recombination and multiple exciton generation signals in semiconductor quantum dots arise from surface charge trapping // Journal of Chemical Physics. 2011. Vol. 134. No. 9. p. 94706.
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TY - JOUR
DO - 10.1063/1.3561063
UR - https://doi.org/10.1063/1.3561063
TI - False multiple exciton recombination and multiple exciton generation signals in semiconductor quantum dots arise from surface charge trapping
T2 - Journal of Chemical Physics
AU - Tyagi, Pooja
AU - Kambhampati, Patanjali
PY - 2011
DA - 2011/03/07 00:00:00
PB - American Institute of Physics (AIP)
SP - 94706
IS - 9
VL - 134
SN - 0021-9606
SN - 1089-7690
ER -
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@article{2011_Tyagi,
author = {Pooja Tyagi and Patanjali Kambhampati},
title = {False multiple exciton recombination and multiple exciton generation signals in semiconductor quantum dots arise from surface charge trapping},
journal = {Journal of Chemical Physics},
year = {2011},
volume = {134},
publisher = {American Institute of Physics (AIP)},
month = {mar},
url = {https://doi.org/10.1063/1.3561063},
number = {9},
pages = {94706},
doi = {10.1063/1.3561063}
}
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Tyagi, Pooja, and Patanjali Kambhampati. “False multiple exciton recombination and multiple exciton generation signals in semiconductor quantum dots arise from surface charge trapping.” Journal of Chemical Physics, vol. 134, no. 9, Mar. 2011, p. 94706. https://doi.org/10.1063/1.3561063.
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