Applied Physics Letters, volume 108, issue 4, pages 42604
Low-temperature characterization of Nb-Cu-Nb weak links with Ar ion-cleaned interfaces
Publication type: Journal Article
Publication date: 2016-01-25
Journal:
Applied Physics Letters
Quartile SCImago
Q1
Quartile WOS
Q2
Impact factor: 4
ISSN: 00036951, 10773118
Physics and Astronomy (miscellaneous)
Abstract
We characterize niobium-based lateral Superconductor (S)–Normal metal (N)–Superconductor (SNS) weak links through low-temperature switching current measurements and tunnel spectroscopy. We fabricate the SNS devices in two separate lithography and deposition steps, combined with strong argon ion cleaning before the normal metal deposition in the last step. Our SNS weak link consists of high-quality sputtered Nb electrodes that have contacted with evaporated Cu. The two-step fabrication flow enables more flexibility in the choice of materials and pattern design. A comparison of the temperature-dependent equilibrium critical supercurrent with theoretical predictions indicates that the quality of the Nb-Cu interface is similar to that of evaporated Al-Cu weak links. We further demonstrate a hybrid magnetic flux sensor based on an Nb-Cu-Nb SNS junction, where the phase-dependent normal metal density of states is probed with an Al tunnel junction.
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Citations by publishers
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Springer Nature
9 publications, 50%
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3 publications, 16.67%
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1 publication, 5.56%
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- We do not take into account publications without a DOI.
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- Statistics recalculated weekly.
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Jabdaraghi R. N. et al. Low-temperature characterization of Nb-Cu-Nb weak links with Ar ion-cleaned interfaces // Applied Physics Letters. 2016. Vol. 108. No. 4. p. 42604.
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Jabdaraghi R. N., Peltonen J. T., Saira O., Pekola J. P. Low-temperature characterization of Nb-Cu-Nb weak links with Ar ion-cleaned interfaces // Applied Physics Letters. 2016. Vol. 108. No. 4. p. 42604.
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TY - JOUR
DO - 10.1063/1.4940979
UR - https://doi.org/10.1063/1.4940979
TI - Low-temperature characterization of Nb-Cu-Nb weak links with Ar ion-cleaned interfaces
T2 - Applied Physics Letters
AU - Jabdaraghi, R. N.
AU - Peltonen, J T
AU - Saira, O.-P.
AU - Pekola, J. P.
PY - 2016
DA - 2016/01/25
PB - American Institute of Physics (AIP)
SP - 42604
IS - 4
VL - 108
SN - 0003-6951
SN - 1077-3118
ER -
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@article{2016_Jabdaraghi,
author = {R. N. Jabdaraghi and J T Peltonen and O.-P. Saira and J. P. Pekola},
title = {Low-temperature characterization of Nb-Cu-Nb weak links with Ar ion-cleaned interfaces},
journal = {Applied Physics Letters},
year = {2016},
volume = {108},
publisher = {American Institute of Physics (AIP)},
month = {jan},
url = {https://doi.org/10.1063/1.4940979},
number = {4},
pages = {42604},
doi = {10.1063/1.4940979}
}
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Jabdaraghi, R. N., et al. “Low-temperature characterization of Nb-Cu-Nb weak links with Ar ion-cleaned interfaces.” Applied Physics Letters, vol. 108, no. 4, Jan. 2016, p. 42604. https://doi.org/10.1063/1.4940979.