Bi-SQUIDs with submicron cross-type Josephson tunnel junctions
A Sharafiev
1
,
Igor I. Soloviev
2
,
V.K Kornev
1
,
M. Schmelz
3
,
Ronny Stolz
3
,
V. Zakosarenko
3
,
S. Anders
3
,
H G MEYER
3
3
Institute for Photonic Technology, Albert-Einstein Street 9, D-07745 Jena, Germany
|
Publication type: Journal Article
Publication date: 2012-02-14
scimago Q1
wos Q2
SJR: 1.095
CiteScore: 6.7
Impact factor: 4.2
ISSN: 09532048, 13616668
Materials Chemistry
Metals and Alloys
Ceramics and Composites
Condensed Matter Physics
Electrical and Electronic Engineering
Abstract
We present and discuss results for the experimental evaluation of bi-SQUIDs with shunted submicron cross-type Josephson tunnel junctions characterized by low capacitance. Such a technology, meant for SQUID sensors, was developed to enable unshielded operation of the sensors and to avoid unwanted flux trapping. The obtained voltage response swing is as high as 60 µV. The observed differences between the measured and theoretically predicted voltage responses are analyzed and the possible ways to approach a triangular voltage response shape are discussed. An improved design of such bi-SQUIDs with gradiometric topology is suggested to compensate for the influence of the sizable parasitic three-junction loop, which is the main drawback of the implemented bi-SQUID topology.
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Total citations:
16
Citations from 2024:
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(6%)
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Sharafiev A. et al. Bi-SQUIDs with submicron cross-type Josephson tunnel junctions // Superconductor Science and Technology. 2012. Vol. 25. No. 4. p. 45001.
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Sharafiev A., Soloviev I. I., Kornev V., Schmelz M., Stolz R., Zakosarenko V., Anders S., MEYER H. G. Bi-SQUIDs with submicron cross-type Josephson tunnel junctions // Superconductor Science and Technology. 2012. Vol. 25. No. 4. p. 45001.
Cite this
RIS
Copy
TY - JOUR
DO - 10.1088/0953-2048/25/4/045001
UR - https://doi.org/10.1088/0953-2048/25/4/045001
TI - Bi-SQUIDs with submicron cross-type Josephson tunnel junctions
T2 - Superconductor Science and Technology
AU - Sharafiev, A
AU - Soloviev, Igor I.
AU - Kornev, V.K
AU - Schmelz, M.
AU - Stolz, Ronny
AU - Zakosarenko, V.
AU - Anders, S.
AU - MEYER, H G
PY - 2012
DA - 2012/02/14
PB - IOP Publishing
SP - 45001
IS - 4
VL - 25
SN - 0953-2048
SN - 1361-6668
ER -
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BibTex (up to 50 authors)
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@article{2012_Sharafiev,
author = {A Sharafiev and Igor I. Soloviev and V.K Kornev and M. Schmelz and Ronny Stolz and V. Zakosarenko and S. Anders and H G MEYER},
title = {Bi-SQUIDs with submicron cross-type Josephson tunnel junctions},
journal = {Superconductor Science and Technology},
year = {2012},
volume = {25},
publisher = {IOP Publishing},
month = {feb},
url = {https://doi.org/10.1088/0953-2048/25/4/045001},
number = {4},
pages = {45001},
doi = {10.1088/0953-2048/25/4/045001}
}
Cite this
MLA
Copy
Sharafiev, A., et al. “Bi-SQUIDs with submicron cross-type Josephson tunnel junctions.” Superconductor Science and Technology, vol. 25, no. 4, Feb. 2012, p. 45001. https://doi.org/10.1088/0953-2048/25/4/045001.
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