Development of SiC power module structure by micron-sized Ag-paste sinter joining on both die and heatsink to low-thermal-resistance and superior power cycling reliability
Chuantong Chen
1
,
Aiji Suetake
1
,
Fupeng Huo
1
,
Dongjin Kim
2
,
Zheng Zhang
1
,
Ming-Chun Hsieh
1
,
Wanli Li
3
,
Naoki Wakasugi
4
,
Kazutaka Takeshita
4, 5
,
Yoshiji Yamaguchi
4, 5
,
Yashima Momose
4, 5
,
Katsuaki Suganuma
1
4
Yamato Scientific Company Ltd., Tokyo, Japan
|
5
Yamato Scientific Co. Ltd., Tokyo, Japan
|
Publication type: Journal Article
Publication date: 2024-09-01
scimago Q1
wos Q1
SJR: 3.083
CiteScore: 15.3
Impact factor: 6.5
ISSN: 08858993, 19410107
Abstract
In this study, the thermal characteristics and structure reliability during power cycling for the four types of SiC power module fabricated using a SiC-heater chip, direct bonded aluminum (DBA) substrate, and aluminum (Al) heatsink were evaluated. Two die-attach materials, including a Sn-Ag-Cu (SAC 305) solder and an Ag paste sinter, were used to bond the SiC to DBA substrate. Furthermore, three types of substrates bonding layer, including SAC solder and Ag paste sinter, and Si grease, were used to bond the DBA substrate to Al heatsink. The large area bonding between the DBA substrate (30 x 30 mm2) and Al heatsink was achieved. In addition, comparing with the tradition SAC solder-Si grease joint structure, the SiC chip temperature decreased from 265.5 ℃ to 180.4 ℃ and the total thermal resistance of the joint structure decreased from 1.58 K/W to 0.85 K/W for the Ag-Ag sinter joint at the same input power. The heat dissipation improved by 1.86 times. The results were validated and fit well using 3D finite element analysis. The failure time was improved 14.5 times from 2340 cycles to 33926 cycles for the AgAg sinter joint during the power cycling test. This study will help us to create a SiC power device structure that is smaller, thinner, and possesses ultra-low thermal resistance, and high reliability.
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18
Total citations:
18
Citations from 2024:
17
(94.45%)
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GOST
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Chen C. et al. Development of SiC power module structure by micron-sized Ag-paste sinter joining on both die and heatsink to low-thermal-resistance and superior power cycling reliability // IEEE Transactions on Power Electronics. 2024. Vol. 39. No. 9. pp. 10638-10650.
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Chen C., Suetake A., Huo F., Kim D., Zhang Z., Hsieh M., Li W., Wakasugi N., Takeshita K., Yamaguchi Y., Momose Y., Suganuma K. Development of SiC power module structure by micron-sized Ag-paste sinter joining on both die and heatsink to low-thermal-resistance and superior power cycling reliability // IEEE Transactions on Power Electronics. 2024. Vol. 39. No. 9. pp. 10638-10650.
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RIS
Copy
TY - JOUR
DO - 10.1109/tpel.2024.3408798
UR - https://ieeexplore.ieee.org/document/10547343/
TI - Development of SiC power module structure by micron-sized Ag-paste sinter joining on both die and heatsink to low-thermal-resistance and superior power cycling reliability
T2 - IEEE Transactions on Power Electronics
AU - Chen, Chuantong
AU - Suetake, Aiji
AU - Huo, Fupeng
AU - Kim, Dongjin
AU - Zhang, Zheng
AU - Hsieh, Ming-Chun
AU - Li, Wanli
AU - Wakasugi, Naoki
AU - Takeshita, Kazutaka
AU - Yamaguchi, Yoshiji
AU - Momose, Yashima
AU - Suganuma, Katsuaki
PY - 2024
DA - 2024/09/01
PB - Institute of Electrical and Electronics Engineers (IEEE)
SP - 10638-10650
IS - 9
VL - 39
SN - 0885-8993
SN - 1941-0107
ER -
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BibTex (up to 50 authors)
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@article{2024_Chen,
author = {Chuantong Chen and Aiji Suetake and Fupeng Huo and Dongjin Kim and Zheng Zhang and Ming-Chun Hsieh and Wanli Li and Naoki Wakasugi and Kazutaka Takeshita and Yoshiji Yamaguchi and Yashima Momose and Katsuaki Suganuma},
title = {Development of SiC power module structure by micron-sized Ag-paste sinter joining on both die and heatsink to low-thermal-resistance and superior power cycling reliability},
journal = {IEEE Transactions on Power Electronics},
year = {2024},
volume = {39},
publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
month = {sep},
url = {https://ieeexplore.ieee.org/document/10547343/},
number = {9},
pages = {10638--10650},
doi = {10.1109/tpel.2024.3408798}
}
Cite this
MLA
Copy
Chen, Chuantong, et al. “Development of SiC power module structure by micron-sized Ag-paste sinter joining on both die and heatsink to low-thermal-resistance and superior power cycling reliability.” IEEE Transactions on Power Electronics, vol. 39, no. 9, Sep. 2024, pp. 10638-10650. https://ieeexplore.ieee.org/document/10547343/.