IEEE Transactions on Device and Materials Reliability
Institute of Electrical and Electronics Engineers (IEEE)
ISSN:
15304388, 15582574
SCImago
Q2
WOS
Q2
Impact factor
2.5
SJR
0.436
CiteScore
4.8
Categories
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Electronic, Optical and Magnetic Materials
Areas
Engineering
Materials Science
Years of issue
2001-2024
Top-3 citing journals
Microelectronics Reliability
(1961 citations)
IEEE Transactions on Electron Devices
(1718 citations)
IEEE Transactions on Device and Materials Reliability
(1634 citations)
Top-3 organizations
National Yang Ming Chiao Tung University
(74 publications)
Interuniversity Microelectronics Centre
(58 publications)
University of Maryland, College Park
(56 publications)
Interuniversity Microelectronics Centre
(17 publications)
Indian Institute of Technology Delhi
(10 publications)
National Yang Ming Chiao Tung University
(10 publications)
Most cited in 5 years
Found
Top-100
Citing journals
Citing publishers
Publishing organizations
Publishing organizations in 5 years
Publishing countries
Publishing countries in 5 years
1 profile journal article
Pandey Rahul
🥼 🤝Chitkara University
215 publications,
4 204 citations
h-index: 37
1 profile journal article
Kompa Guenter
University of Kassel
89 publications,
1 212 citations
h-index: 13
1 profile journal article
Martin Dalton
28 publications,
125 citations
h-index: 7