What's Wrong With Low-Code Development Platforms? An Empirical Study of Low-Code Development Platform Bugs
Тип публикации: Journal Article
Дата публикации: 2024-03-01
SCImago Q1
Tоп 10% SCImago
WOS Q1
БС1
SJR: 1.16
CiteScore: 11.6
Impact factor: 5.7
ISSN: 00189529, 15581721
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Краткое описание
Low-code development platforms (LCDPs) are increasingly being introduced and leveraged by major IT enterprises to lower the threshold and promote the efficiency of software development. Like other software systems, LCDPs are also inevitable to have bugs. The bugs in LCDPs may cause unpredictable consequences as they pose risks to all the downstream software products. However, to the best of our knowledge, there exist no studies that ever consider the bugs caused by LCDPs. To handle the LCDP bugs better, in this article, we conduct an empirical study of the characteristics of LCDP bugs by examining 974 confirmed bugs of four dominant LCDPs (i.e., OutSystems, Mendix, Appsmith, and Budibase) from both commercial and open-source domains. These bugs are analyzed from three perspectives, including bug root causes, bug symptoms, and the affected stages of LCDPs. Based on the analysis, we obtain a series of valuable findings. For example, around 60% of the bugs reside in the stage of designing and specifying the developed applications. Over 37% of the bugs lead LCDPs to behave unexpectedly but without showing explicit signs. Moreover, the bugs relevant to the incorrect graphics of user interfaces are significant due to the characteristics of LCDPs. These findings point out the guidelines, challenges, and future directions to address LCDP bugs.
Найдено
Ничего не найдено, попробуйте изменить настройки фильтра.
Для доступа к списку цитирований публикации необходимо авторизоваться.
Топ-30
Журналы
|
1
|
|
|
Journal of Cheminformatics
1 публикация, 8.33%
|
|
|
ACM Transactions on Software Engineering and Methodology
1 публикация, 8.33%
|
|
|
Revista de Estudos Interdisciplinares
1 публикация, 8.33%
|
|
|
IEEE Transactions on Reliability
1 публикация, 8.33%
|
|
|
Informatik aktuell
1 публикация, 8.33%
|
|
|
Computers
1 публикация, 8.33%
|
|
|
1
|
Издатели
|
1
2
3
4
5
6
|
|
|
Institute of Electrical and Electronics Engineers (IEEE)
6 публикаций, 50%
|
|
|
Springer Nature
2 публикации, 16.67%
|
|
|
MDPI
2 публикации, 16.67%
|
|
|
Association for Computing Machinery (ACM)
1 публикация, 8.33%
|
|
|
Centro de Estudos Interdisciplinares
1 публикация, 8.33%
|
|
|
1
2
3
4
5
6
|
- Мы не учитываем публикации, у которых нет DOI.
- Статистика публикаций обновляется еженедельно.
Вы ученый?
Создайте профиль, чтобы получать персональные рекомендации коллег, конференций и новых статей.
Войти с ORCID
Метрики
12
Всего цитирований:
12
Цитирований c 2025:
7
(58.33%)
Цитировать
ГОСТ |
RIS |
BibTex |
MLA
Цитировать
ГОСТ
Скопировать
Liu D. et al. What's Wrong With Low-Code Development Platforms? An Empirical Study of Low-Code Development Platform Bugs // IEEE Transactions on Reliability. 2024. Vol. 73. No. 1. pp. 695-709.
ГОСТ со всеми авторами (до 50)
Скопировать
Liu D., Jiang H., Guo S., Chen Y., Chen Y., Lei Q. What's Wrong With Low-Code Development Platforms? An Empirical Study of Low-Code Development Platform Bugs // IEEE Transactions on Reliability. 2024. Vol. 73. No. 1. pp. 695-709.
Цитировать
RIS
Скопировать
TY - JOUR
DO - 10.1109/tr.2023.3295009
UR - https://ieeexplore.ieee.org/document/10203030/
TI - What's Wrong With Low-Code Development Platforms? An Empirical Study of Low-Code Development Platform Bugs
T2 - IEEE Transactions on Reliability
AU - Liu, Dong
AU - Jiang, He
AU - Guo, Shikai
AU - Chen, Yuting
AU - Chen, Yu‐Ting
AU - Lei, Qiao
PY - 2024
DA - 2024/03/01
PB - Institute of Electrical and Electronics Engineers (IEEE)
SP - 695-709
IS - 1
VL - 73
SN - 0018-9529
SN - 1558-1721
ER -
Цитировать
BibTex (до 50 авторов)
Скопировать
@article{2024_Liu,
author = {Dong Liu and He Jiang and Shikai Guo and Yuting Chen and Yu‐Ting Chen and Qiao Lei},
title = {What's Wrong With Low-Code Development Platforms? An Empirical Study of Low-Code Development Platform Bugs},
journal = {IEEE Transactions on Reliability},
year = {2024},
volume = {73},
publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
month = {mar},
url = {https://ieeexplore.ieee.org/document/10203030/},
number = {1},
pages = {695--709},
doi = {10.1109/tr.2023.3295009}
}
Цитировать
MLA
Скопировать
Liu, Dong, et al. “What's Wrong With Low-Code Development Platforms? An Empirical Study of Low-Code Development Platform Bugs.” IEEE Transactions on Reliability, vol. 73, no. 1, Mar. 2024, pp. 695-709. https://ieeexplore.ieee.org/document/10203030/.
Ошибка в публикации?