IEEE Transactions on Reliability

Institute of Electrical and Electronics Engineers (IEEE)
ISSN:
00189529, 15581721
Are you a researcher?
Create a profile to get free access to personal recommendations for colleagues and new articles.
SCImago
Q1
WOS
Q1
Impact factor
5
SJR
1.511
CiteScore
12.2
Categories
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Areas
Engineering
Years of issue
1963-2025
journal names
IEEE Transactions on Reliability
IEEE T RELIAB
Top-3 citing journals

IEEE Transactions on Reliability
(12857 citations)

Reliability Engineering and System Safety
(9611 citations)

Microelectronics Reliability
(3242 citations)
Top-3 organizations

Beihang University
(82 publications)

University of Electronic Science and Technology of China
(74 publications)

Rutgers, The State University of New Jersey
(67 publications)

Beihang University
(45 publications)

University of Electronic Science and Technology of China
(28 publications)

City University of Hong Kong
(20 publications)
Most cited in 5 years
Found
Nothing found, try to update filter.
Found
Nothing found, try to update filter.
Top-100
Citing journals
Citing publishers
Publishing organizations
Publishing organizations in 5 years
Publishing countries
Publishing countries in 5 years
2 profile journal articles
Pozo Aurora
163 publications,
1 313 citations
h-index: 19
1 profile journal article
Ramanathan Thekke

Savitribai Phule Pune University
44 publications,
229 citations
h-index: 9
1 profile journal article
Fonseca José
23 publications,
400 citations
h-index: 12
1 profile journal article
Grauby Stephane
60 publications,
1 039 citations
h-index: 17