Institute of Electrical and Electronics Engineers (IEEE)

IEEE Transactions on Applied Superconductivity

, volume 3 , issue 1 , pages 2170-2173

Proximity effect in Nb/Al, AlOoxide, Al/Nb Josephson tunnel junctions

Evert Houwman ¹

J. G. Gijsbertsen ¹

J. Flokstra ¹

H. Rogalla ¹

J. B. le Grand ²

P. A. J. de Korte ²

Hide authors affiliations Show authors affiliations: 2 affiliations

Dept. of Appl. Phys., Twente Univ., Enschede, Netherlands |

[Space Research Organization of Netherlands, Utrecht, Netherlands] |

Publication type: Journal Article

Publication date: 1993-03-01

Institute of Electrical and Electronics Engineers (IEEE)

IEEE Transactions on Applied Superconductivity

scimago Q2

wos Q3

SJR: 0.508

CiteScore: 3.4

Impact factor: 1.8

ISSN: 10518223, 15582515, 23787074

DOI: 10.1109/77.233933

Copy DOI

Electronic, Optical and Magnetic Materials

Condensed Matter Physics

Electrical and Electronic Engineering

Abstract

Regions with reduced energy gap induced by the proximity effect give rise to quasi-particle loss in Josephson-junction X-ray detectors, but may also be used advantageously for quasi-particle collection. The influence of the thickness of the Al proximity layers in Nb/Al/sub 1/, AlO/sub x/, Al/sub 2//Nb Josephson tunnel junctions on the electrical characteristics has been investigated theoretically and experimentally. Theoretically it is found that the strength of the proximity effect is mainly determined by the proximity effect is mainly determined by the proximity parameters gamma /sub M1/ ( gamma /sub M2/) of the electrodes. Good fits of the measured I-V curves with theory were obtained for junctions with thicknesses d/sub A11/ ranging from 4 to 25 nm and d/sub A12/=3 nm, with gamma /sub M2/ approximately=0.12 and gamma /sub M1// gamma /sub M2/=d/sub A11//d/sub A12/. For all junctions the proximity knee remains more pronounced than predicted.< >

Found

1 citation

Golubov Alexander

DSc in Physics and Mathematics, professor

409 publications, 15 021 citations, 17 reviews

h-index: 57

Moscow Institute of Physics and Technology

University of Twente

Research interests

Quantum Physics

Superconducting electronics

Superconductivity

Topological insulator

Top-30

Journals

	1 2
Journal of Low Temperature Physics	Journal of Low Temperature Physics, 2, 28.57% Journal of Low Temperature Physics 2 publications, 28.57%
Physical Review B	Physical Review B, 1, 14.29% Physical Review B 1 publication, 14.29%
International Journal of Infrared and Millimeter Waves	International Journal of Infrared and Millimeter Waves, 1, 14.29% International Journal of Infrared and Millimeter Waves 1 publication, 14.29%
Superconductor Science and Technology	Superconductor Science and Technology, 1, 14.29% Superconductor Science and Technology 1 publication, 14.29%
	1 2

Publishers

	1 2 3 4
Springer Nature	Springer Nature, 4, 57.14% Springer Nature 4 publications, 57.14%
American Physical Society (APS)	American Physical Society (APS), 1, 14.29% American Physical Society (APS) 1 publication, 14.29%
IOP Publishing	IOP Publishing, 1, 14.29% IOP Publishing 1 publication, 14.29%
	1 2 3 4

We do not take into account publications without a DOI.
Statistics recalculated weekly.

Are you a researcher?

Create a profile to get free access to personal recommendations for colleagues and new articles.

Metrics

Cite this

GOST |

Cite this

GOST Copy

Houwman E. et al. Proximity effect in Nb/Al, AlOoxide, Al/Nb Josephson tunnel junctions // IEEE Transactions on Applied Superconductivity. 1993. Vol. 3. No. 1. pp. 2170-2173.

GOST all authors (up to 50) Copy

Houwman E., Gijsbertsen J. G., Flokstra J., Rogalla H., le Grand J. B., de Korte P. A. J. Proximity effect in Nb/Al, AlOoxide, Al/Nb Josephson tunnel junctions // IEEE Transactions on Applied Superconductivity. 1993. Vol. 3. No. 1. pp. 2170-2173.

RIS |

Cite this

RIS Copy

TY - JOUR

DO - 10.1109/77.233933

UR - https://doi.org/10.1109/77.233933

TI - Proximity effect in Nb/Al, AlOoxide, Al/Nb Josephson tunnel junctions

T2 - IEEE Transactions on Applied Superconductivity

AU - Houwman, Evert

AU - Gijsbertsen, J. G.

AU - Flokstra, J.

AU - Rogalla, H.

AU - le Grand, J. B.

AU - de Korte, P. A. J.

PY - 1993

DA - 1993/03/01

PB - Institute of Electrical and Electronics Engineers (IEEE)

SP - 2170-2173

IS - 1

VL - 3

SN - 1051-8223

SN - 1558-2515

SN - 2378-7074

ER -

BibTex |

Cite this

BibTex (up to 50 authors) Copy

@article{1993_Houwman,

author = {Evert Houwman and J. G. Gijsbertsen and J. Flokstra and H. Rogalla and J. B. le Grand and P. A. J. de Korte},

title = {Proximity effect in Nb/Al, AlOoxide, Al/Nb Josephson tunnel junctions},

journal = {IEEE Transactions on Applied Superconductivity},

year = {1993},

volume = {3},

publisher = {Institute of Electrical and Electronics Engineers (IEEE)},

month = {mar},

url = {https://doi.org/10.1109/77.233933},

number = {1},

pages = {2170--2173},

doi = {10.1109/77.233933}

}

MLA

Cite this

MLA Copy

Houwman, Evert, et al. “Proximity effect in Nb/Al, AlOoxide, Al/Nb Josephson tunnel junctions.” IEEE Transactions on Applied Superconductivity, vol. 3, no. 1, Mar. 1993, pp. 2170-2173. https://doi.org/10.1109/77.233933.