IEEE Transactions on Applied Superconductivity, volume 29, issue 5, pages 1-9
Very Large Scale Integration of Josephson-Junction-Based Superconductor Random Access Memories
Publication type: Journal Article
Publication date: 2019-08-01
Quartile SCImago
Q2
Quartile WOS
Q3
Impact factor: 1.8
ISSN: 10518223, 15582515
Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering
Abstract
Arrays of vortex transitional (VT) memory cells with functional density up to 1 Mbit/cm
2
have been designed, fabricated, and successfully demonstrated. This progress is due to recent advances in design optimization and in superconductor electronics fabrication achieved at MIT Lincoln Laboratory. As a starting point, we developed a demo array of VT cells for the 100-μA/μm
2
MIT LL fabrication process SFQ5ee with eight niobium layers. The studied two-junction memory cell with a two-junction nondestructive readout occupied 168 μm
2
, resulting in an over 0.5 Mbit/cm
2
functional density. Then, we reduced the cell area down to 99 μm
2
(corresponding to over 0.9 Mbit/cm
2
functional density) by utilizing self-shunted Josephson junctions (JJs) with critical current density JC of 600 μA/μm
2
and eliminating shunt resistors. The fabricated high-JC memory cells were fully operational and possessed wide read/write current margins, quite close to the theoretically predicted values. We discuss approaches to further increasing the integration scale of superconductor memory and logic circuits: 1) miniaturization of superconducting transformers by using soft magnetic materials; and 2) reduction of JJ area by using planar high-JC junctions similar to variable thickness bridges.
Top-30
Citations by journals
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IEEE Transactions on Applied Superconductivity
9 publications, 24.32%
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5 publications, 13.51%
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3 publications, 8.11%
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2 publications, 5.41%
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Applied Physics Letters
2 publications, 5.41%
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JETP Letters
1 publication, 2.7%
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Physical Review B
1 publication, 2.7%
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ACS Nano
1 publication, 2.7%
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IEEE Magnetics Letters
1 publication, 2.7%
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IEEE Solid-State Circuits Letters
1 publication, 2.7%
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Nature Communications
1 publication, 2.7%
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Physical Review Letters
1 publication, 2.7%
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Scientific Reports
1 publication, 2.7%
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Mesoscience and Nanotechnology
1 publication, 2.7%
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Citations by publishers
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IEEE
14 publications, 37.84%
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IOP Publishing
5 publications, 13.51%
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American Physical Society (APS)
4 publications, 10.81%
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American Chemical Society (ACS)
3 publications, 8.11%
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Multidisciplinary Digital Publishing Institute (MDPI)
3 publications, 8.11%
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American Institute of Physics (AIP)
2 publications, 5.41%
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Springer Nature
2 publications, 5.41%
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Pleiades Publishing
1 publication, 2.7%
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Association for Computing Machinery (ACM)
1 publication, 2.7%
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Treatise
1 publication, 2.7%
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- We do not take into account publications without a DOI.
- Statistics recalculated only for publications connected to researchers, organizations and labs registered on the platform.
- Statistics recalculated weekly.
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Semenov V. et al. Very Large Scale Integration of Josephson-Junction-Based Superconductor Random Access Memories // IEEE Transactions on Applied Superconductivity. 2019. Vol. 29. No. 5. pp. 1-9.
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Semenov V., Polyakov Y. A., Tolpygo S. K. Very Large Scale Integration of Josephson-Junction-Based Superconductor Random Access Memories // IEEE Transactions on Applied Superconductivity. 2019. Vol. 29. No. 5. pp. 1-9.
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TY - JOUR
DO - 10.1109/TASC.2019.2904971
UR - https://doi.org/10.1109/TASC.2019.2904971
TI - Very Large Scale Integration of Josephson-Junction-Based Superconductor Random Access Memories
T2 - IEEE Transactions on Applied Superconductivity
AU - Semenov, V.K.
AU - Polyakov, Yuri A
AU - Tolpygo, Sergey K.
PY - 2019
DA - 2019/08/01
PB - IEEE
SP - 1-9
IS - 5
VL - 29
SN - 1051-8223
SN - 1558-2515
ER -
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@article{2019_Semenov,
author = {V.K. Semenov and Yuri A Polyakov and Sergey K. Tolpygo},
title = {Very Large Scale Integration of Josephson-Junction-Based Superconductor Random Access Memories},
journal = {IEEE Transactions on Applied Superconductivity},
year = {2019},
volume = {29},
publisher = {IEEE},
month = {aug},
url = {https://doi.org/10.1109/TASC.2019.2904971},
number = {5},
pages = {1--9},
doi = {10.1109/TASC.2019.2904971}
}
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Semenov, V.K., et al. “Very Large Scale Integration of Josephson-Junction-Based Superconductor Random Access Memories.” IEEE Transactions on Applied Superconductivity, vol. 29, no. 5, Aug. 2019, pp. 1-9. https://doi.org/10.1109/TASC.2019.2904971.