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volume 370 issue 6522 pages 1313-1317

Reversible planar gliding and microcracking in a single-crystalline Ni-rich cathode

Publication typeJournal Article
Publication date2020-12-11
scimago Q1
wos Q1
SJR10.416
CiteScore48.4
Impact factor45.8
ISSN00368075, 10959203
Multidisciplinary
Abstract
Cracking the problem of cracking cathodes Polycrystalline cathode materials that contain a combination of nickel, manganese, and cobalt have been used for advanced lithium batteries. These materials fracture at high voltage, which increases surface area and leads to more side reactions and shorter cycle life. Using single-crystalline samples as model materials, Bi et al. observed changes in nickel-rich cathodes to study the fracture behavior under well-characterized conditions. As the material is charged and lithium is removed, specific planes glide over one another and microcracks are observed. However, this process is reversed on discharge, removing all traces of the microcracking. The authors developed a diffusion-induced stress model to understand the origin of the planar gliding and propose ways to stabilize these nickel-rich cathodes in working batteries. Science, this issue p. 1313 Reversible gliding and microcracking of lattice planes are observed in single-crystalline Ni-rich cathode materials. High-energy nickel (Ni)–rich cathode will play a key role in advanced lithium (Li)–ion batteries, but it suffers from moisture sensitivity, side reactions, and gas generation. Single-crystalline Ni-rich cathode has a great potential to address the challenges present in its polycrystalline counterpart by reducing phase boundaries and materials surfaces. However, synthesis of high-performance single-crystalline Ni-rich cathode is very challenging, notwithstanding a fundamental linkage between overpotential, microstructure, and electrochemical behaviors in single-crystalline Ni-rich cathodes. We observe reversible planar gliding and microcracking along the (003) plane in a single-crystalline Ni-rich cathode. The reversible formation of microstructure defects is correlated with the localized stresses induced by a concentration gradient of Li atoms in the lattice, providing clues to mitigate particle fracture from synthesis modifications.
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GOST |
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GOST Copy
Bi Y. et al. Reversible planar gliding and microcracking in a single-crystalline Ni-rich cathode // Science. 2020. Vol. 370. No. 6522. pp. 1313-1317.
GOST all authors (up to 50) Copy
Bi Y., Tao J., Wu Y., Li L., Xu Y., Hu E., Wu B., Hu J., Wang C., Zhang J., Qi Y., Xiao J. Reversible planar gliding and microcracking in a single-crystalline Ni-rich cathode // Science. 2020. Vol. 370. No. 6522. pp. 1313-1317.
RIS |
Cite this
RIS Copy
TY - JOUR
DO - 10.1126/science.abc3167
UR - https://doi.org/10.1126/science.abc3167
TI - Reversible planar gliding and microcracking in a single-crystalline Ni-rich cathode
T2 - Science
AU - Bi, Yujing
AU - Tao, Jinhui
AU - Wu, Yuqin
AU - Li, Linze
AU - Xu, Yaobin
AU - Hu, Enyuan
AU - Wu, Bingbin
AU - Hu, Jiangtao
AU - Wang, Chongmin
AU - Zhang, Ji-Guang
AU - Qi, Yue
AU - Xiao, Jie
PY - 2020
DA - 2020/12/11
PB - American Association for the Advancement of Science (AAAS)
SP - 1313-1317
IS - 6522
VL - 370
PMID - 33303612
SN - 0036-8075
SN - 1095-9203
ER -
BibTex |
Cite this
BibTex (up to 50 authors) Copy
@article{2020_Bi,
author = {Yujing Bi and Jinhui Tao and Yuqin Wu and Linze Li and Yaobin Xu and Enyuan Hu and Bingbin Wu and Jiangtao Hu and Chongmin Wang and Ji-Guang Zhang and Yue Qi and Jie Xiao},
title = {Reversible planar gliding and microcracking in a single-crystalline Ni-rich cathode},
journal = {Science},
year = {2020},
volume = {370},
publisher = {American Association for the Advancement of Science (AAAS)},
month = {dec},
url = {https://doi.org/10.1126/science.abc3167},
number = {6522},
pages = {1313--1317},
doi = {10.1126/science.abc3167}
}
MLA
Cite this
MLA Copy
Bi, Yujing, et al. “Reversible planar gliding and microcracking in a single-crystalline Ni-rich cathode.” Science, vol. 370, no. 6522, Dec. 2020, pp. 1313-1317. https://doi.org/10.1126/science.abc3167.