Open Access
Open access
volume 12 issue 2 pages 290

Experimental Study of Irradiation of Thin Oxide and Mo/Si Multilayers by High Brightness Broadband VUV/UV Radiation and Their Degradation

Publication typeJournal Article
Publication date2022-02-21
scimago Q2
wos Q2
SJR0.539
CiteScore5.4
Impact factor2.8
ISSN20796412
Materials Chemistry
Surfaces, Coatings and Films
Surfaces and Interfaces
Abstract

This study discusses the main features of the irradiation of prospective multilayer coatings by VUV/UV radiation from compressed plasma flows. Such radiation is characterized by a broadband spectrum and high brightness fluxes. Oxide and Mo/Si bilayers were used as the basis of the reflective multilayers for the visible and UV ranges. A gas-dynamic response from the irradiated surfaces was studied with schlieren photography. The properties of original and irradiated multilayers were described with ultra violet visible infrared spectroscopy (UV-Vis-IR), X-ray diffraction (XRD), X-ray reflectometry, scanning electron microscopy (SEM) and other techniques. Data on the degradation of optical properties and surface morphology were obtained.

Found 
Found 

Top-30

Journals

1
Polymers
1 publication, 14.29%
Journal of Physics: Conference Series
1 publication, 14.29%
Sensors
1 publication, 14.29%
Nanomaterials
1 publication, 14.29%
Physics of Atomic Nuclei
1 publication, 14.29%
Technologies
1 publication, 14.29%
High Energy Chemistry
1 publication, 14.29%
1

Publishers

1
2
3
4
MDPI
4 publications, 57.14%
Pleiades Publishing
2 publications, 28.57%
IOP Publishing
1 publication, 14.29%
1
2
3
4
  • We do not take into account publications without a DOI.
  • Statistics recalculated weekly.

Are you a researcher?

Create a profile to get free access to personal recommendations for colleagues and new articles.
Metrics
7
Share
Cite this
GOST |
Cite this
GOST Copy
Telekh V. D. et al. Experimental Study of Irradiation of Thin Oxide and Mo/Si Multilayers by High Brightness Broadband VUV/UV Radiation and Their Degradation // Coatings. 2022. Vol. 12. No. 2. p. 290.
GOST all authors (up to 50) Copy
Telekh V. D., Pavlov A. V., Pavlov A. V., Kirillov D. V., Vorobev E. V., Turyanskiy A. G., Senkov V. M., Tsygankov P. A., Parada Becerra F. F., Parada-Becerra F. F., Vesnin V. R., Skriabin A. S. Experimental Study of Irradiation of Thin Oxide and Mo/Si Multilayers by High Brightness Broadband VUV/UV Radiation and Their Degradation // Coatings. 2022. Vol. 12. No. 2. p. 290.
RIS |
Cite this
RIS Copy
TY - JOUR
DO - 10.3390/coatings12020290
UR - https://www.mdpi.com/2079-6412/12/2/290
TI - Experimental Study of Irradiation of Thin Oxide and Mo/Si Multilayers by High Brightness Broadband VUV/UV Radiation and Their Degradation
T2 - Coatings
AU - Telekh, Victor D
AU - Pavlov, Aleksei V
AU - Pavlov, A V
AU - Kirillov, Daniil V
AU - Vorobev, Evgeny V
AU - Turyanskiy, Alexander G
AU - Senkov, Viacheslav M
AU - Tsygankov, Petr A
AU - Parada Becerra, Freddy F
AU - Parada-Becerra, Freddy F.
AU - Vesnin, Vladimir R
AU - Skriabin, Andrei S
PY - 2022
DA - 2022/02/21
PB - MDPI
SP - 290
IS - 2
VL - 12
SN - 2079-6412
ER -
BibTex |
Cite this
BibTex (up to 50 authors) Copy
@article{2022_Telekh,
author = {Victor D Telekh and Aleksei V Pavlov and A V Pavlov and Daniil V Kirillov and Evgeny V Vorobev and Alexander G Turyanskiy and Viacheslav M Senkov and Petr A Tsygankov and Freddy F Parada Becerra and Freddy F. Parada-Becerra and Vladimir R Vesnin and Andrei S Skriabin},
title = {Experimental Study of Irradiation of Thin Oxide and Mo/Si Multilayers by High Brightness Broadband VUV/UV Radiation and Their Degradation},
journal = {Coatings},
year = {2022},
volume = {12},
publisher = {MDPI},
month = {feb},
url = {https://www.mdpi.com/2079-6412/12/2/290},
number = {2},
pages = {290},
doi = {10.3390/coatings12020290}
}
MLA
Cite this
MLA Copy
Telekh, Victor D., et al. “Experimental Study of Irradiation of Thin Oxide and Mo/Si Multilayers by High Brightness Broadband VUV/UV Radiation and Their Degradation.” Coatings, vol. 12, no. 2, Feb. 2022, p. 290. https://www.mdpi.com/2079-6412/12/2/290.