2006 European Solid-State Device Research Conference

Institute of Electrical and Electronics Engineers (IEEE)
Institute of Electrical and Electronics Engineers (IEEE)
ISSN: 19308876

Are you a researcher?

Create a profile to get free access to personal recommendations for colleagues and new articles.
SJR
0.223
CiteScore
1.8
journal names
2006 European Solid-State Device Research Conference
Publications
68
Citations
368
h-index
10
Publications
0
Citations
78
Top-3 citing journals

Most cited in 5 years

Found 
Found 

Top-100

Citing journals

10
20
30
40
50
60
IEEE Transactions on Electron Devices
55 citations, 14.95%
Solid-State Electronics
32 citations, 8.7%
IEEE Electron Device Letters
15 citations, 4.08%
IEEE Transactions on Nanotechnology
14 citations, 3.8%
Silicon
8 citations, 2.17%
Microelectronics Reliability
5 citations, 1.36%
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
5 citations, 1.36%
Lecture Notes in Electrical Engineering
5 citations, 1.36%
IEEE Journal of the Electron Devices Society
4 citations, 1.09%
Microelectronics Journal
4 citations, 1.09%
Journal of Computational Electronics
4 citations, 1.09%
Microsystem Technologies
3 citations, 0.82%
Journal of Applied Physics
3 citations, 0.82%
Nanotechnology
3 citations, 0.82%
Microelectronic Engineering
3 citations, 0.82%
IET Circuits, Devices and Systems
3 citations, 0.82%
Micromachines
2 citations, 0.54%
IEEE Transactions on Circuits and Systems I: Regular Papers
2 citations, 0.54%
Applied Physics Letters
2 citations, 0.54%
IEEE Journal of Quantum Electronics
2 citations, 0.54%
Journal of Lightwave Technology
2 citations, 0.54%
Communications in Computer and Information Science
2 citations, 0.54%
Nano Letters
2 citations, 0.54%
International Journal of Embedded and Real-Time Communication Systems
2 citations, 0.54%
IEEE Transactions on Microwave Theory and Techniques
2 citations, 0.54%
IEEE Journal of Solid-State Circuits
2 citations, 0.54%
Journal Physics D: Applied Physics
2 citations, 0.54%
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2 citations, 0.54%
IEEE Design & Test of Computers
2 citations, 0.54%
Discover Nano
2 citations, 0.54%
Integrated Circuits and Systems
2 citations, 0.54%
IEICE Transactions on Electronics
1 citation, 0.27%
Lecture Notes in Computer Science
1 citation, 0.27%
Journal of Materials Research
1 citation, 0.27%
ACS applied materials & interfaces
1 citation, 0.27%
Microelectronics International
1 citation, 0.27%
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
1 citation, 0.27%
Journal of Materials Chemistry C
1 citation, 0.27%
Advanced Electronic Materials
1 citation, 0.27%
Journal of Physics Condensed Matter
1 citation, 0.27%
Nanomaterials
1 citation, 0.27%
IEEE Transactions on Device and Materials Reliability
1 citation, 0.27%
Journal of Electronic Testing: Theory and Applications (JETTA)
1 citation, 0.27%
IEEE Transactions on Instrumentation and Measurement
1 citation, 0.27%
Nano Research
1 citation, 0.27%
IEEE Solid-State Circuits Magazine
1 citation, 0.27%
Scientific Reports
1 citation, 0.27%
Advances in Intelligent Systems and Computing
1 citation, 0.27%
Transactions on Electrical and Electronic Materials
1 citation, 0.27%
Critical Reviews in Solid State and Materials Sciences
1 citation, 0.27%
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
1 citation, 0.27%
Expert Review of Medical Devices
1 citation, 0.27%
Journal of King Saud University - Science
1 citation, 0.27%
International Journal of Modern Physics B
1 citation, 0.27%
Current Applied Physics
1 citation, 0.27%
Physica Scripta
1 citation, 0.27%
IEEE Microwave Magazine
1 citation, 0.27%
Journal of Microelectromechanical Systems
1 citation, 0.27%
Journal of Materials Science: Materials in Electronics
1 citation, 0.27%
IEEE Transactions on Components, Packaging and Manufacturing Technology
1 citation, 0.27%
Advances in Imaging and Electron Physics
1 citation, 0.27%
International Journal of RF and Microwave Computer-Aided Engineering
1 citation, 0.27%
Superlattices and Microstructures
1 citation, 0.27%
Semiconductor Science and Technology
1 citation, 0.27%
ACM Transactions on Design Automation of Electronic Systems
1 citation, 0.27%
IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers
1 citation, 0.27%
IEEE Transactions on Power Electronics
1 citation, 0.27%
Russian Microelectronics
1 citation, 0.27%
Proceedings of the IEEE
1 citation, 0.27%
IEEE Access
1 citation, 0.27%
ACS Applied Electronic Materials
1 citation, 0.27%
SSRN Electronic Journal
1 citation, 0.27%
Engineering Research Express
1 citation, 0.27%
Analytical Imaging Techniques for Soft Matter Characterization
1 citation, 0.27%
2006 Proceedings of the 32nd European Solid-State Circuits Conference
1 citation, 0.27%
2007 International Semiconductor Conference
1 citation, 0.27%
10
20
30
40
50
60

Citing publishers

20
40
60
80
100
120
140
160
180
Institute of Electrical and Electronics Engineers (IEEE)
178 citations, 48.37%
Elsevier
49 citations, 13.32%
Springer Nature
35 citations, 9.51%
IOP Publishing
9 citations, 2.45%
Wiley
5 citations, 1.36%
AIP Publishing
5 citations, 1.36%
Japan Society of Applied Physics
5 citations, 1.36%
American Chemical Society (ACS)
4 citations, 1.09%
Institution of Engineering and Technology (IET)
3 citations, 0.82%
MDPI
3 citations, 0.82%
Association for Computing Machinery (ACM)
3 citations, 0.82%
Taylor & Francis
2 citations, 0.54%
IGI Global
2 citations, 0.54%
IntechOpen
2 citations, 0.54%
World Scientific
1 citation, 0.27%
Emerald
1 citation, 0.27%
1 citation, 0.27%
Pleiades Publishing
1 citation, 0.27%
Royal Society of Chemistry (RSC)
1 citation, 0.27%
King Saud University
1 citation, 0.27%
Optica Publishing Group
1 citation, 0.27%
The Korean Institute of Electrical and Electronic Material Engineers
1 citation, 0.27%
Social Science Electronic Publishing
1 citation, 0.27%
20
40
60
80
100
120
140
160
180