Open Access
Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy
Neal Fairley
1
,
Catherine Guillot-Deudon
2
,
John Walton
3
,
Delphine Flahaut
4
,
Mireille Richard-Plouet
2
,
Emily M. Smith
5
,
Mark Greiner
6
,
Mark Biesinger
7
,
S Tougaard
8
,
David F. Morgan
9
,
Jonas Baltrusaitis
10
1
Casa Software Ltd.
2
Institut des Matériaux Jean Rouxel
3
TSTC CIO
4
Institut des Sciences Analytiques et de Physico-chimie pour l'Environnement et les Materiaux
7
UNIVERSITY OF WESTERN ONTARIO
|
Publication type: Journal Article
Publication date: 2021-09-01
scimago Q1
wos Q1
SJR: 1.467
CiteScore: 15.3
Impact factor: 8.7
ISSN: 26665239
Surfaces, Coatings and Films
Surfaces and Interfaces
Abstract
The methodology presented within this work is a result of years of interactions between many junior and senior X-ray Photoelectron Spectroscopy (XPS) users operating within the CasaXPS spectral processing and interpretation program framework. In particular, discussions arising from a series of workshops have been a significant source for developing the overall XPS data processing concept and are the motivation for creating this work. These workshops organized by the Institut des Matériaux Jean Rouxel (IMN), Nantes gather both experienced and novice users of XPS for a week of discourse in conceptual experiment design and the resulting data processing. However, the framework constructed and utilized within these workshops encouraged the dissemination of knowledge beyond XPS data analysis and emphasized the importance of a multi-disciplinary collaborative approach to surface analysis problem-solving. The material presented here embodies data treatment originating from data made available to the first CNRS Thematic Workshop presented at Roscoff 2013. The methodology described here has evolved over the subsequent workshops in 2016 and 2019 and currently represents the philosophy used in CasaXPS spectral data processing paradigm.
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Fairley N. et al. Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy // Applied Surface Science Advances. 2021. Vol. 5. p. 100112.
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Fairley N., Guillot-Deudon C., Walton J., Flahaut D., Fernandez V., Richard-Plouet M., Smith E. M., Greiner M., Biesinger M., Tougaard S., Morgan D. F., Baltrusaitis J. Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy // Applied Surface Science Advances. 2021. Vol. 5. p. 100112.
Cite this
RIS
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TY - JOUR
DO - 10.1016/j.apsadv.2021.100112
UR - https://linkinghub.elsevier.com/retrieve/pii/S2666523921000581
TI - Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy
T2 - Applied Surface Science Advances
AU - Fairley, Neal
AU - Guillot-Deudon, Catherine
AU - Walton, John
AU - Flahaut, Delphine
AU - Fernandez, Vincent
AU - Richard-Plouet, Mireille
AU - Smith, Emily M.
AU - Greiner, Mark
AU - Biesinger, Mark
AU - Tougaard, S
AU - Morgan, David F.
AU - Baltrusaitis, Jonas
PY - 2021
DA - 2021/09/01
PB - Elsevier
SP - 100112
VL - 5
SN - 2666-5239
ER -
Cite this
BibTex (up to 50 authors)
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@article{2021_Fairley,
author = {Neal Fairley and Catherine Guillot-Deudon and John Walton and Delphine Flahaut and Vincent Fernandez and Mireille Richard-Plouet and Emily M. Smith and Mark Greiner and Mark Biesinger and S Tougaard and David F. Morgan and Jonas Baltrusaitis},
title = {Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy},
journal = {Applied Surface Science Advances},
year = {2021},
volume = {5},
publisher = {Elsevier},
month = {sep},
url = {https://linkinghub.elsevier.com/retrieve/pii/S2666523921000581},
pages = {100112},
doi = {10.1016/j.apsadv.2021.100112}
}