Open Access
Damage-free plasma etching of porous organo-silicate low-k using micro-capillary condensation above −50 °C
R Chanson
1
,
L. Zhang
1
,
S. Naumov
2
,
Yu.A. Mankelevich
3
,
T Tillocher
4
,
P. Lefaucheux
4
,
R Dussart
4
,
S De Gendt
5
,
J F De Marneffe
1
2
Leibniz-Institut fur Oberflachenmodifizierun, Leipzig, Germany
|
Publication type: Journal Article
Publication date: 2018-01-30
scimago Q1
wos Q1
SJR: 0.874
CiteScore: 6.7
Impact factor: 3.9
ISSN: 20452322
PubMed ID:
29382890
Multidisciplinary
Abstract
The micro-capillary condensation of a new high boiling point organic reagent (HBPO), is studied in a periodic mesoporous oxide (PMO) with ∼34 % porosity and k-value ∼2.3. At a partial pressure of 3 mT, the onset of micro-capillary condensation occurs around +20 °C and the low-k matrix is filled at −20 °C. The condensed phase shows high stability from −50 < T ≤−35 °C, and persists in the pores when the low-k is exposed to a SF6-based plasma discharge. The etching properties of a SF6-based 150W-biased plasma discharge, using as additive this new HBPO gas, shows that negligible damage can be achieved at −50 °C, with acceptable etch rates. The evolution of the damage depth as a function of time was studied without bias and indicates that Si-CH3 loss occurs principally through Si-C dissociation by VUV photons.
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GOST
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Chanson R. et al. Damage-free plasma etching of porous organo-silicate low-k using micro-capillary condensation above −50 °C // Scientific Reports. 2018. Vol. 8. No. 1. 1886
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Chanson R., Zhang L., Naumov S., Mankelevich Y., Tillocher T., Lefaucheux P., Dussart R., Gendt S. D., Marneffe J. F. D. Damage-free plasma etching of porous organo-silicate low-k using micro-capillary condensation above −50 °C // Scientific Reports. 2018. Vol. 8. No. 1. 1886
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RIS
Copy
TY - JOUR
DO - 10.1038/s41598-018-20099-5
UR - https://doi.org/10.1038/s41598-018-20099-5
TI - Damage-free plasma etching of porous organo-silicate low-k using micro-capillary condensation above −50 °C
T2 - Scientific Reports
AU - Chanson, R
AU - Zhang, L.
AU - Naumov, S.
AU - Mankelevich, Yu.A.
AU - Tillocher, T
AU - Lefaucheux, P.
AU - Dussart, R
AU - Gendt, S De
AU - Marneffe, J F De
PY - 2018
DA - 2018/01/30
PB - Springer Nature
IS - 1
VL - 8
PMID - 29382890
SN - 2045-2322
ER -
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BibTex (up to 50 authors)
Copy
@article{2018_Chanson,
author = {R Chanson and L. Zhang and S. Naumov and Yu.A. Mankelevich and T Tillocher and P. Lefaucheux and R Dussart and S De Gendt and J F De Marneffe},
title = {Damage-free plasma etching of porous organo-silicate low-k using micro-capillary condensation above −50 °C},
journal = {Scientific Reports},
year = {2018},
volume = {8},
publisher = {Springer Nature},
month = {jan},
url = {https://doi.org/10.1038/s41598-018-20099-5},
number = {1},
pages = {1886},
doi = {10.1038/s41598-018-20099-5}
}