Open Access
Open access
volume 5 issue 1 pages 11301

A review of Ga2O3 materials, processing, and devices

Publication typeJournal Article
Publication date2018-01-11
scimago Q1
wos Q1
SJR2.904
CiteScore17.8
Impact factor11.6
ISSN19319401
General Physics and Astronomy
Abstract

Gallium oxide (Ga2O3) is emerging as a viable candidate for certain classes of power electronics, solar blind UV photodetectors, solar cells, and sensors with capabilities beyond existing technologies due to its large bandgap. It is usually reported that there are five different polymorphs of Ga2O3, namely, the monoclinic (β-Ga2O3), rhombohedral (α), defective spinel (γ), cubic (δ), or orthorhombic (ε) structures. Of these, the β-polymorph is the stable form under normal conditions and has been the most widely studied and utilized. Since melt growth techniques can be used to grow bulk crystals of β-GaO3, the cost of producing larger area, uniform substrates is potentially lower compared to the vapor growth techniques used to manufacture bulk crystals of GaN and SiC. The performance of technologically important high voltage rectifiers and enhancement-mode Metal-Oxide Field Effect Transistors benefit from the larger critical electric field of β-Ga2O3 relative to either SiC or GaN. However, the absence of clear demonstrations of p-type doping in Ga2O3, which may be a fundamental issue resulting from the band structure, makes it very difficult to simultaneously achieve low turn-on voltages and ultra-high breakdown. The purpose of this review is to summarize recent advances in the growth, processing, and device performance of the most widely studied polymorph, β-Ga2O3. The role of defects and impurities on the transport and optical properties of bulk, epitaxial, and nanostructures material, the difficulty in p-type doping, and the development of processing techniques like etching, contact formation, dielectrics for gate formation, and passivation are discussed. Areas where continued development is needed to fully exploit the properties of Ga2O3 are identified.

Found 
Found 

Top-30

Journals

50
100
150
200
250
Applied Physics Letters
209 publications, 8.07%
Journal of Applied Physics
94 publications, 3.63%
ECS Journal of Solid State Science and Technology
91 publications, 3.51%
IEEE Transactions on Electron Devices
81 publications, 3.13%
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
73 publications, 2.82%
Journal of Alloys and Compounds
66 publications, 2.55%
ACS applied materials & interfaces
63 publications, 2.43%
APL Materials
57 publications, 2.2%
Applied Surface Science
56 publications, 2.16%
Journal Physics D: Applied Physics
54 publications, 2.08%
Journal of Materials Chemistry C
48 publications, 1.85%
ACS Applied Electronic Materials
42 publications, 1.62%
IEEE Electron Device Letters
41 publications, 1.58%
Materials Science in Semiconductor Processing
41 publications, 1.58%
Semiconductor Science and Technology
39 publications, 1.51%
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
36 publications, 1.39%
Nanomaterials
32 publications, 1.24%
AIP Advances
30 publications, 1.16%
Materials
30 publications, 1.16%
Applied Physics Express
29 publications, 1.12%
Materials Today Physics
28 publications, 1.08%
Ceramics International
27 publications, 1.04%
Journal of Crystal Growth
24 publications, 0.93%
Physica Status Solidi (B): Basic Research
23 publications, 0.89%
Journal of Electronic Materials
22 publications, 0.85%
Advanced Electronic Materials
20 publications, 0.77%
Journal of Materials Science: Materials in Electronics
20 publications, 0.77%
Journal of Physical Chemistry C
20 publications, 0.77%
Physical Review B
18 publications, 0.69%
50
100
150
200
250

Publishers

100
200
300
400
500
600
Elsevier
516 publications, 19.92%
AIP Publishing
408 publications, 15.75%
Institute of Electrical and Electronics Engineers (IEEE)
264 publications, 10.19%
American Chemical Society (ACS)
222 publications, 8.57%
Wiley
183 publications, 7.07%
IOP Publishing
178 publications, 6.87%
Springer Nature
161 publications, 6.22%
MDPI
121 publications, 4.67%
Royal Society of Chemistry (RSC)
105 publications, 4.05%
The Electrochemical Society
92 publications, 3.55%
American Vacuum Society
86 publications, 3.32%
Japan Society of Applied Physics
61 publications, 2.36%
American Physical Society (APS)
39 publications, 1.51%
Optica Publishing Group
24 publications, 0.93%
Pleiades Publishing
22 publications, 0.85%
Oxford University Press
9 publications, 0.35%
Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
8 publications, 0.31%
ITMO University
8 publications, 0.31%
Taylor & Francis
7 publications, 0.27%
World Scientific
6 publications, 0.23%
Science in China Press
6 publications, 0.23%
Walter de Gruyter
5 publications, 0.19%
SPIE-Intl Soc Optical Eng
5 publications, 0.19%
EDP Sciences
2 publications, 0.08%
Institution of Engineering and Technology (IET)
2 publications, 0.08%
Ceramic Society of Japan
2 publications, 0.08%
Shanghai Institute of Optics and Fine Mechanics
2 publications, 0.08%
Tsinghua University Press
2 publications, 0.08%
National Academy of Sciences of Ukraine - Institute of Semiconductor Physics
2 publications, 0.08%
100
200
300
400
500
600
  • We do not take into account publications without a DOI.
  • Statistics recalculated weekly.

Are you a researcher?

Create a profile to get free access to personal recommendations for colleagues and new articles.
Metrics
2.6k
Share
Cite this
GOST |
Cite this
GOST Copy
Pearton S. J. et al. A review of Ga2O3 materials, processing, and devices // Applied Physics Reviews. 2018. Vol. 5. No. 1. p. 11301.
GOST all authors (up to 50) Copy
Pearton S. J., Yang J., Carey P. H., Ren F., Kim J., Tadjer M. J., Mastro M. A. A review of Ga2O3 materials, processing, and devices // Applied Physics Reviews. 2018. Vol. 5. No. 1. p. 11301.
RIS |
Cite this
RIS Copy
TY - JOUR
DO - 10.1063/1.5006941
UR - https://doi.org/10.1063/1.5006941
TI - A review of Ga2O3 materials, processing, and devices
T2 - Applied Physics Reviews
AU - Pearton, Stephen J.
AU - Yang, Jiancheng
AU - Carey, Patrick H.
AU - Ren, F.
AU - Kim, Jihyun
AU - Tadjer, Marko J
AU - Mastro, Michael A
PY - 2018
DA - 2018/01/11
PB - AIP Publishing
SP - 11301
IS - 1
VL - 5
SN - 1931-9401
ER -
BibTex |
Cite this
BibTex (up to 50 authors) Copy
@article{2018_Pearton,
author = {Stephen J. Pearton and Jiancheng Yang and Patrick H. Carey and F. Ren and Jihyun Kim and Marko J Tadjer and Michael A Mastro},
title = {A review of Ga2O3 materials, processing, and devices},
journal = {Applied Physics Reviews},
year = {2018},
volume = {5},
publisher = {AIP Publishing},
month = {jan},
url = {https://doi.org/10.1063/1.5006941},
number = {1},
pages = {11301},
doi = {10.1063/1.5006941}
}
MLA
Cite this
MLA Copy
Pearton, Stephen J., et al. “A review of Ga2O3 materials, processing, and devices.” Applied Physics Reviews, vol. 5, no. 1, Jan. 2018, p. 11301. https://doi.org/10.1063/1.5006941.