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Signatures of temperature driven antiferromagnetic transition in the electronic structure of topological insulator MnBi2Te4

Тип публикацииJournal Article
Дата публикации2020-02-01
scimago Q1
wos Q2
БС1
SJR1.124
CiteScore7.9
Impact factor4.5
ISSN2166532X
General Materials Science
General Engineering
Краткое описание

In this work, we employed angle resolved photoemission spectroscopy (ARPES) to analyze the temperature dependent changes in the electronic structure of the first antiferromagnetic topological insulator MnBi2Te4 upon crossing the Néel temperature TN ≈ 25 K. We observed an exchange splitting of the bulk conduction band, which has a power law dependence on temperature (1−T/T0)2β with an onset temperature T0 well matching the measured bulk TN. We found a matching temperature evolution of the topological surface states integrated spectral weight in the vicinity of the Dirac point. Furthermore, we observed an additional quasi-2D state with Rashba-type splitting, which is also affected by the emerged magnetism and exhibits an opening of a gap, reminiscent of the effect of an out-of-plane magnetic field, below TN. All these findings point toward strong evidence of the interplay between emerged magnetism with bulk and topological surface states. The observed temperature-dependent effects in MnBi2Te4 may be used as an experimental fingerprint for the presence of magnetism and may guide the future analysis of ARPES spectra in magnetic topological insulators.

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Estyunin D. A. et al. Signatures of temperature driven antiferromagnetic transition in the electronic structure of topological insulator MnBi2Te4 // APL Materials. 2020. Vol. 8. No. 2. p. 21105.
ГОСТ со всеми авторами (до 50) Скопировать
Estyunin D. A., Klimovskikh I. I., SHIKIN A. M., Schwier E. F., Otrokov M. M., Kimura A., Kumar S., Filnov S. O., Aliev Z. S., Babanly M., CHULKOV E. V. Signatures of temperature driven antiferromagnetic transition in the electronic structure of topological insulator MnBi2Te4 // APL Materials. 2020. Vol. 8. No. 2. p. 21105.
RIS |
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TY - JOUR
DO - 10.1063/1.5142846
UR - https://pubs.aip.org/apm/article/8/2/021105/122835/Signatures-of-temperature-driven-antiferromagnetic
TI - Signatures of temperature driven antiferromagnetic transition in the electronic structure of topological insulator MnBi2Te4
T2 - APL Materials
AU - Estyunin, Dmitry A.
AU - Klimovskikh, I I
AU - SHIKIN, A. M.
AU - Schwier, Eike. F.
AU - Otrokov, M M
AU - Kimura, A.
AU - Kumar, S.
AU - Filnov, S O
AU - Aliev, Ziya S.
AU - Babanly, M.
AU - CHULKOV, E. V.
PY - 2020
DA - 2020/02/01
PB - AIP Publishing
SP - 21105
IS - 2
VL - 8
SN - 2166-532X
ER -
BibTex |
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BibTex (до 50 авторов) Скопировать
@article{2020_Estyunin,
author = {Dmitry A. Estyunin and I I Klimovskikh and A. M. SHIKIN and Eike. F. Schwier and M M Otrokov and A. Kimura and S. Kumar and S O Filnov and Ziya S. Aliev and M. Babanly and E. V. CHULKOV},
title = {Signatures of temperature driven antiferromagnetic transition in the electronic structure of topological insulator MnBi2Te4},
journal = {APL Materials},
year = {2020},
volume = {8},
publisher = {AIP Publishing},
month = {feb},
url = {https://pubs.aip.org/apm/article/8/2/021105/122835/Signatures-of-temperature-driven-antiferromagnetic},
number = {2},
pages = {21105},
doi = {10.1063/1.5142846}
}
MLA
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Estyunin, Dmitry A., et al. “Signatures of temperature driven antiferromagnetic transition in the electronic structure of topological insulator MnBi2Te4.” APL Materials, vol. 8, no. 2, Feb. 2020, p. 21105. https://pubs.aip.org/apm/article/8/2/021105/122835/Signatures-of-temperature-driven-antiferromagnetic.