Nondestructure diagnostics of surface layers elements content for cylindrical shape material objects

V.K. Egorov ¹

E. V. Egorov, ^{1, 2, 3}

Hide authors affiliations

Institute of Microelectronics Technology, Russian Academy of Sciences, 142432, Chernogolovka, Russia |

Institute of Radio Engineering and Electronics, Russian Academy of Sciences, 141190, Fryazino, Russia |

Financial University under the government of the Russian Federation, 125167, Moscow, Russia |

Publication type: Journal Article

Publication date: 2020-12-01

IOP Publishing

Journal: Journal of Physics: Conference Series

SJR: 0.180

CiteScore: 1.2

Impact factor: —

ISSN: 17426588, 17426596

DOI: 10.1088/1742-6596/1713/1/012015

Copy DOI

General Physics and Astronomy

Abstract

The methodics background for the nondestructive element concentration diagnostics of cylindric shape material objects surface layer is developed. The diagnostics is produced without objects form-factor distortion on base of ion beams and X-ray analytical methods. The depth element concentration distribution determination found on the ion beams Rutherford backscattering data and results of X-ray fluorescence testing in conditions of TXRF modified measurements. Possibilities of the elaborated analytical conception are illustrated by experimental data obtained at study of element content in surface layer of the nuclear heat release cell shell.