Superconductor Science and Technology, volume 34, issue 8, pages 85007
Density of states and current-voltage characteristics in SIsFS junctions
Publication type: Journal Article
Publication date: 2021-06-25
Quartile SCImago
Q1
Quartile WOS
Q2
Impact factor: 3.6
ISSN: 09532048, 13616668
Materials Chemistry
Metals and Alloys
Ceramics and Composites
Condensed Matter Physics
Electrical and Electronic Engineering
Abstract
We study the density of states (DOS) inside superconducting Josephson SIsFS junctions with complex interlayer consisting of a thin superconducting spacer 's' between insulator I and a ferromagnetic metal F. The consideration is focused on the local density of states in the vicinity of a tunnel barrier, and it permits to estimate the current-voltage characteristics in the resistive state of such junctions. We study the influence of the proximity effect and Zeeman splitting on the properties of the system, and we find significant sub-gap regions with non-vanishing DOS. We also find manifestations of the 0-$\pi$ transition in the behavior of DOS in a thin s-layer. These properties lead to appearance of new characteristic features on I-V curves which provide additional information about electronic states inside the junction.
Citations by journals
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1
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Materials
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Materials
1 publication, 50%
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Physics of Metals and Metallography
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Physics of Metals and Metallography
1 publication, 50%
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1
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Citations by publishers
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1
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Multidisciplinary Digital Publishing Institute (MDPI)
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Multidisciplinary Digital Publishing Institute (MDPI)
1 publication, 50%
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Pleiades Publishing
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Pleiades Publishing
1 publication, 50%
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1
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Bakurskiy S. et al. Density of states and current-voltage characteristics in SIsFS junctions // Superconductor Science and Technology. 2021. Vol. 34. No. 8. p. 85007.
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Bakurskiy S., Neilo A. A., Klenov N. V., Soloviev I. I., Golubov A. A., Yu Kupriyanov M. Density of states and current-voltage characteristics in SIsFS junctions // Superconductor Science and Technology. 2021. Vol. 34. No. 8. p. 85007.
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TY - JOUR
DO - 10.1088/1361-6668/ac0870
UR - https://doi.org/10.1088%2F1361-6668%2Fac0870
TI - Density of states and current-voltage characteristics in SIsFS junctions
T2 - Superconductor Science and Technology
AU - Bakurskiy, S.V.
AU - Neilo, A A
AU - Klenov, Nikolay V.
AU - Soloviev, Igor I.
AU - Golubov, A. A.
AU - Yu Kupriyanov, M
PY - 2021
DA - 2021/06/25 00:00:00
PB - IOP Publishing
SP - 85007
IS - 8
VL - 34
SN - 0953-2048
SN - 1361-6668
ER -
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@article{2021_Bakurskiy,
author = {S.V. Bakurskiy and A A Neilo and Nikolay V. Klenov and Igor I. Soloviev and A. A. Golubov and M Yu Kupriyanov},
title = {Density of states and current-voltage characteristics in SIsFS junctions},
journal = {Superconductor Science and Technology},
year = {2021},
volume = {34},
publisher = {IOP Publishing},
month = {jun},
url = {https://doi.org/10.1088%2F1361-6668%2Fac0870},
number = {8},
pages = {85007},
doi = {10.1088/1361-6668/ac0870}
}
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MLA
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Bakurskiy, S.V., et al. “Density of states and current-voltage characteristics in SIsFS junctions.” Superconductor Science and Technology, vol. 34, no. 8, Jun. 2021, p. 85007. https://doi.org/10.1088%2F1361-6668%2Fac0870.