Open Access
Open access
IOP Publishing
Journal of Physics: Conference Series
,  volume 808 ,  issue 1 ,  pages 12002

TXRF spectrometry at ion beam excitation

V. Egorov
, 
E. Egorov
, 
M Afanasef
Publication type: Journal Article
Publication date: 2017-02-21
IOP Publishing
SJR: 0.187
CiteScore: 1.3
Impact factor: —
ISSN: 17426588, 17426596
General Physics and Astronomy
Abstract
The work presents short discussion of TXRF and PIXE methods peculiarities. Taking into account of these peculiarities we elaborate the experimental scheme for TXRF measurements at ion beam excitation of characteristical fluorescence. The scheme is built on base of the planar X-ray waveguide-resonator with specific design. Features of the new experimental method and possibilities of Sokol-3 ion beam analytical complex were used for the method application in real measurements.
Found 
Found 

Top-30

Journals

1
Instruments and Experimental Techniques
Instruments and Experimental Techniques, 1, 50%
Instruments and Experimental Techniques
1 publication, 50%
1

Publishers

1
Pleiades Publishing
Pleiades Publishing, 1, 50%
Pleiades Publishing
1 publication, 50%
IntechOpen, 1, 50%
IntechOpen
1 publication, 50%
1
  • We do not take into account publications without a DOI.
  • Statistics recalculated weekly.

Are you a researcher?

Create a profile to get free access to personal recommendations for colleagues and new articles.
Metrics
2
Share
Cite this
GOST |
Cite this
GOST Copy
Egorov V., Egorov E., Afanasef M. TXRF spectrometry at ion beam excitation // Journal of Physics: Conference Series. 2017. Vol. 808. No. 1. p. 12002.
GOST all authors (up to 50) Copy
Egorov V., Egorov E., Afanasef M. TXRF spectrometry at ion beam excitation // Journal of Physics: Conference Series. 2017. Vol. 808. No. 1. p. 12002.
RIS |
Cite this
RIS Copy
TY - JOUR
DO - 10.1088/1742-6596/808/1/012002
UR - https://iopscience.iop.org/article/10.1088/1742-6596/808/1/012002
TI - TXRF spectrometry at ion beam excitation
T2 - Journal of Physics: Conference Series
AU - Egorov, V.
AU - Egorov, E.
AU - Afanasef, M
PY - 2017
DA - 2017/02/21
PB - IOP Publishing
SP - 12002
IS - 1
VL - 808
SN - 1742-6588
SN - 1742-6596
ER -
BibTex |
Cite this
BibTex (up to 50 authors) Copy
@article{2017_Egorov,
author = {V. Egorov and E. Egorov and M Afanasef},
title = {TXRF spectrometry at ion beam excitation},
journal = {Journal of Physics: Conference Series},
year = {2017},
volume = {808},
publisher = {IOP Publishing},
month = {feb},
url = {https://iopscience.iop.org/article/10.1088/1742-6596/808/1/012002},
number = {1},
pages = {12002},
doi = {10.1088/1742-6596/808/1/012002}
}
MLA
Cite this
MLA Copy
Egorov, V., et al. “TXRF spectrometry at ion beam excitation.” Journal of Physics: Conference Series, vol. 808, no. 1, Feb. 2017, p. 12002. https://iopscience.iop.org/article/10.1088/1742-6596/808/1/012002.