Institute of Electrical and Electronics Engineers (IEEE)

Novel test structures for the investigation of the efficiency of guard rings used for I/O-latch-up prevention

Quincke J.

Publication type: Proceedings Article

Publication date: 1990-01-01

Institute of Electrical and Electronics Engineers (IEEE)

Institute of Electrical and Electronics Engineers (IEEE)

DOI: 10.1109/ICMTS.1990.67876

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Journals

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IEEE Transactions on Electron Devices	IEEE Transactions on Electron Devices, 3, 21.43% IEEE Transactions on Electron Devices 3 publications, 21.43%
IEEE Journal of the Electron Devices Society	IEEE Journal of the Electron Devices Society, 1, 7.14% IEEE Journal of the Electron Devices Society 1 publication, 7.14%
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Institute of Electrical and Electronics Engineers (IEEE)	Institute of Electrical and Electronics Engineers (IEEE), 10, 71.43% Institute of Electrical and Electronics Engineers (IEEE) 10 publications, 71.43%
Wiley	Wiley, 3, 21.43% Wiley 3 publications, 21.43%
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Institute of Electrical and Electronics Engineers (IEEE)

Institute of Electrical and Electronics Engineers (IEEE)