Analytical Description of Low-Tc DC SQUID Response and Methods for Its Linearization

Тип публикацииProceedings Article
Дата публикации2017-06-01
Краткое описание
We derived inductance-dependent expressions for time-averaged voltage-flux and voltage-current dependencies of Low-Tc DC SQUID. Utilization of these expressions speeds up optimization of real devices and expands possibilities for their analytical study. Optimization of voltage response linearity of two SQUIDs connected in series is presented as an example of application of the proposed analytics.
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Soloviev I. I. et al. Analytical Description of Low-Tc DC SQUID Response and Methods for Its Linearization // 2017 16th International Superconductive Electronics Conference, ISEC 2017. 2017. Vol. 2018-January. pp. 1-3.
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Soloviev I. I., Klenov N. V., Tereshonok M., Golubov A. A., Schegolev A. E., Bakurskiy S., Kupriyanov M. Yu. Analytical Description of Low-Tc DC SQUID Response and Methods for Its Linearization // 2017 16th International Superconductive Electronics Conference, ISEC 2017. 2017. Vol. 2018-January. pp. 1-3.
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TY - CPAPER
DO - 10.1109/ISEC.2017.8314221
UR - https://doi.org/10.1109/ISEC.2017.8314221
TI - Analytical Description of Low-Tc DC SQUID Response and Methods for Its Linearization
T2 - 2017 16th International Superconductive Electronics Conference, ISEC 2017
AU - Soloviev, Igor I.
AU - Klenov, Nikolay V.
AU - Tereshonok, M.V.
AU - Golubov, Alexander A.
AU - Schegolev, Andrey E.
AU - Bakurskiy, S.V.
AU - Kupriyanov, M Yu
PY - 2017
DA - 2017/06/01
PB - Institute of Electrical and Electronics Engineers (IEEE)
SP - 1-3
VL - 2018-January
ER -
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@inproceedings{2017_Soloviev,
author = {Igor I. Soloviev and Nikolay V. Klenov and M.V. Tereshonok and Alexander A. Golubov and Andrey E. Schegolev and S.V. Bakurskiy and M Yu Kupriyanov},
title = {Analytical Description of Low-Tc DC SQUID Response and Methods for Its Linearization},
year = {2017},
volume = {2018-January},
pages = {1--3},
month = {jun},
publisher = {Institute of Electrical and Electronics Engineers (IEEE)}
}