volume 13 issue 6 pages 627-632

Characterization of Microwave Properties of Superconducting NbTiN Films using TDS

Publication typeJournal Article
Publication date2023-11-01
scimago Q1
wos Q1
SJR1.178
CiteScore6.8
Impact factor4.0
ISSN2156342X, 21563446
Electrical and Electronic Engineering
Radiation
Abstract
In this article, we perform systematic study of electrodynamic properties of superconducting NbTiN films at frequencies 0.2–2.5 terahertz (THz) and in temperature range from 4 to 15 K using time-domain spectrometer. The goal is to achieve the best parameters of the films at THz frequencies; that is to reach а tradeoff between the highest possible normal state conductivity σ0 , the smallest London penetration depth λL , and the highest energy gap and critical temperature Tc . To do this, it is necessary to determine the optimal manufacturing conditions; to this end, a set of NbTiN films of various compositions was fabricated, controlled by the nitrogen pressure in the magnetron chamber. As a result, the film with parameters σ 0 = 11·10 3 1/(Ohm·сm), λL = 280 nm, and Tc = 14.4 K were obtained. To fit the experimental data, two models with and without taking intragap states into account were used, and both of them are in good agreement with experiment.
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Khan F. et al. Characterization of Microwave Properties of Superconducting NbTiN Films using TDS // IEEE Transactions on Terahertz Science and Technology. 2023. Vol. 13. No. 6. pp. 627-632.
GOST all authors (up to 50) Copy
Khan F., Zhukova E. S., Gorshunov B., Gorshunov B., Kadyrov L. S., Chekushkin A. M., Khudchenko A., Koshelets V. Characterization of Microwave Properties of Superconducting NbTiN Films using TDS // IEEE Transactions on Terahertz Science and Technology. 2023. Vol. 13. No. 6. pp. 627-632.
RIS |
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RIS Copy
TY - JOUR
DO - 10.1109/TTHZ.2023.3321252
UR - https://ieeexplore.ieee.org/document/10268634/
TI - Characterization of Microwave Properties of Superconducting NbTiN Films using TDS
T2 - IEEE Transactions on Terahertz Science and Technology
AU - Khan, F
AU - Zhukova, Elena S.
AU - Gorshunov, B.P.
AU - Gorshunov, Boris
AU - Kadyrov, Lenar S.
AU - Chekushkin, Artem M.
AU - Khudchenko, A.
AU - Koshelets, V.P
PY - 2023
DA - 2023/11/01
PB - Institute of Electrical and Electronics Engineers (IEEE)
SP - 627-632
IS - 6
VL - 13
SN - 2156-342X
SN - 2156-3446
ER -
BibTex |
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BibTex (up to 50 authors) Copy
@article{2023_Khan,
author = {F Khan and Elena S. Zhukova and B.P. Gorshunov and Boris Gorshunov and Lenar S. Kadyrov and Artem M. Chekushkin and A. Khudchenko and V.P Koshelets},
title = {Characterization of Microwave Properties of Superconducting NbTiN Films using TDS},
journal = {IEEE Transactions on Terahertz Science and Technology},
year = {2023},
volume = {13},
publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
month = {nov},
url = {https://ieeexplore.ieee.org/document/10268634/},
number = {6},
pages = {627--632},
doi = {10.1109/TTHZ.2023.3321252}
}
MLA
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MLA Copy
Khan, F., et al. “Characterization of Microwave Properties of Superconducting NbTiN Films using TDS.” IEEE Transactions on Terahertz Science and Technology, vol. 13, no. 6, Nov. 2023, pp. 627-632. https://ieeexplore.ieee.org/document/10268634/.