Journal of Vacuum Science and Technology B, volume 42, issue 4

Future of plasma etching for microelectronics: Challenges and opportunities

G. S. Oehrlein 1
Stephan M. Brandstadter 2
Jane P. Chang 4
Jessica C. DeMott 2
Vincent M. Donnelly 5
R. Dussart 6
Andreas Fischer 7
Richard A. Gottscho 8
Satoshi Hamaguchi 9
Masanobu Honda 10
Masaru Hori 11
Steven G. Jaloviar 12
Keren J. Kanarik 8
Kazuhiro Karahashi 9
Akiteru Ko 13
Hiten Kothari 12
Nobuyuki Kuboi 14
Mark J. Kushner 15
Thorsten Lill 7
Pingshan Luan 13
A. Mesbah 16
Eric Miller 17
Shoubhanik Nath 16
Yoshinobu Ohya 10
Mitsuhiro Omura 18
Chanhoon Park 19
John Poulose 20
Shahid Rauf 20
Makoto Sekine 11
Taylor G. Smith 4
Nathan Stafford 21
Theo Standaert 17
Peter L. G. Ventzek 22
Show full list: 35 authors
2
 
Arkema 2 , King of Prussia, Pennsylvania 19406
7
 
Clarycon Nanotechnology Research 7 , Kalaheo, Hawaii 96741
8
 
Lam Research Corporation 8 , 4650 Cushing Pkwy, Fremont, California 94538
10
 
Tokyo Electron Miyagi Ltd. 10 , 1 Techno-Hills, Taiwa-cho, Kurokawa-gun, Miyagi 981-3629, Japan
12
 
Logic Technology Development, Intel Corporation 12 , 2501 NE Century Blvd, Hillsboro, Oregon 97124
13
 
TEL Technology Center, America, LLC 13 , 255 Fuller Road, Albany, New York 12203
17
 
IBM Semiconductors 17 , 257 Fuller Rd, Albany, New York 12203
18
 
Advanced Memory Development Center, Kioxia Corporation 18 , 800, Yamanoisshiki-cho, Yokkaichi, Mie 512-8550, Japan
20
 
Applied Materials Inc. 20 , 974 E. Arques Ave., Sunnyvale, California 94085
21
 
Delaware Research and Technology Center, American Air Liquide 21 , 200 GBC Dr., Newark, Delaware 19702
22
 
Tokyo Electron America, Inc. 22 , 2400 Grove Blvd, Austin, Texas 78741
Publication typeJournal Article
Publication date2024-06-07
scimago Q3
SJR0.328
CiteScore2.7
Impact factor1.5
ISSN21662746, 21662754
Abstract

Plasma etching is an essential semiconductor manufacturing technology required to enable the current microelectronics industry. Along with lithographic patterning, thin-film formation methods, and others, plasma etching has dynamically evolved to meet the exponentially growing demands of the microelectronics industry that enables modern society. At this time, plasma etching faces a period of unprecedented changes owing to numerous factors, including aggressive transition to three-dimensional (3D) device architectures, process precision approaching atomic-scale critical dimensions, introduction of new materials, fundamental silicon device limits, and parallel evolution of post-CMOS approaches. The vast growth of the microelectronics industry has emphasized its role in addressing major societal challenges, including questions on the sustainability of the associated energy use, semiconductor manufacturing related emissions of greenhouse gases, and others. The goal of this article is to help both define the challenges for plasma etching and point out effective plasma etching technology options that may play essential roles in defining microelectronics manufacturing in the future. The challenges are accompanied by significant new opportunities, including integrating experiments with various computational approaches such as machine learning/artificial intelligence and progress in computational approaches, including the realization of digital twins of physical etch chambers through hybrid/coupled models. These prospects can enable innovative solutions to problems that were not available during the past 50 years of plasma etch development in the microelectronics industry. To elaborate on these perspectives, the present article brings together the views of various experts on the different topics that will shape plasma etching for microelectronics manufacturing of the future.

Found 
Found 

Top-30

Journals

1
2
3
4
1
2
3
4

Publishers

1
2
3
4
5
6
1
2
3
4
5
6
  • We do not take into account publications without a DOI.
  • Statistics recalculated only for publications connected to researchers, organizations and labs registered on the platform.
  • Statistics recalculated weekly.

Are you a researcher?

Create a profile to get free access to personal recommendations for colleagues and new articles.
Share
Cite this
GOST | RIS | BibTex
Found error?