Instruments and Experimental Techniques, volume 62, issue 5, pages 659-663
The Total-Reflection X-Ray Fluorescence Yield Formed by a Waveguide Resonator under Conditions of Ion Beam Excitation
Afanasiev M S
1
,
Egorov V.K.
2
,
Egorov, E. V.
1, 2
,
Kuharskaya N F
1
,
Nabiev A E
3
,
Naryshkina V G
1
Publication type: Journal Article
Publication date: 2019-09-30
Quartile SCImago
Q4
Quartile WOS
Q4
Impact factor: 0.6
ISSN: 00204412, 16083180
Instrumentation
Abstract
The features of methods for total-reflection X-ray fluorescence analysis with proton-induced X‑ray fluorescence emission are described. A setup for obtaining X-ray fluorescence spectra under the conditions of proton-beam excitation has been developed using these methods. The setup is based on a specially designed planar X-ray waveguide resonator. The features of the new experimental diagnostic method in the unique research facility (UNU no. 45) of the Sokol-3 analytical ion-beam complex are discussed; some attention has been paid to the description of the capabilities of this facility.
Citations by journals
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Russian Microelectronics
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Russian Microelectronics
1 publication, 100%
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1
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Citations by publishers
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1
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Pleiades Publishing
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Pleiades Publishing
1 publication, 100%
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1
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Afanasiev M. S. et al. The Total-Reflection X-Ray Fluorescence Yield Formed by a Waveguide Resonator under Conditions of Ion Beam Excitation // Instruments and Experimental Techniques. 2019. Vol. 62. No. 5. pp. 659-663.
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Afanasiev M. S., Egorov V., Egorov, E. V., Kuharskaya N. F., Nabiev A. E., Naryshkina V. G. The Total-Reflection X-Ray Fluorescence Yield Formed by a Waveguide Resonator under Conditions of Ion Beam Excitation // Instruments and Experimental Techniques. 2019. Vol. 62. No. 5. pp. 659-663.
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TY - JOUR
DO - 10.1134/S0020441219050014
UR - https://doi.org/10.1134%2FS0020441219050014
TI - The Total-Reflection X-Ray Fluorescence Yield Formed by a Waveguide Resonator under Conditions of Ion Beam Excitation
T2 - Instruments and Experimental Techniques
AU - Afanasiev, M S
AU - Egorov, V.K.
AU - Egorov,, E. V.
AU - Kuharskaya, N F
AU - Nabiev, A E
AU - Naryshkina, V G
PY - 2019
DA - 2019/09/30 00:00:00
PB - Pleiades Publishing
SP - 659-663
IS - 5
VL - 62
SN - 0020-4412
SN - 1608-3180
ER -
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@article{2019_Afanasiev,
author = {M S Afanasiev and V.K. Egorov and E. V. Egorov, and N F Kuharskaya and A E Nabiev and V G Naryshkina},
title = {The Total-Reflection X-Ray Fluorescence Yield Formed by a Waveguide Resonator under Conditions of Ion Beam Excitation},
journal = {Instruments and Experimental Techniques},
year = {2019},
volume = {62},
publisher = {Pleiades Publishing},
month = {sep},
url = {https://doi.org/10.1134%2FS0020441219050014},
number = {5},
pages = {659--663},
doi = {10.1134/S0020441219050014}
}
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Afanasiev, M. S., et al. “The Total-Reflection X-Ray Fluorescence Yield Formed by a Waveguide Resonator under Conditions of Ion Beam Excitation.” Instruments and Experimental Techniques, vol. 62, no. 5, Sep. 2019, pp. 659-663. https://doi.org/10.1134%2FS0020441219050014.
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