Comparative analysis of TXRF-spectroscopy efficiency under the testing target excitation by fluxes formed by the slit-cut system and waveguide-resonator
Тип публикации: Journal Article
Дата публикации: 2008-12-16
scimago Q4
wos Q4
БС4
SJR: 0.165
CiteScore: 0.8
Impact factor: 0.4
ISSN: 10274510, 18197094
Surfaces, Coatings and Films
Краткое описание
The results of the comparative study of the Ba1.4Y1.0Cu2.4O7.0/SrTiO3 epitaxial structure by the TXRF method under conditions of the exciting flux formation by a slit-cut system and a planar x-ray waveguide resonator (PXWR) with a specific design are presented. Experimental measurements were performed on a TXRF-model spectrometer built on the base of an HZG-4 precision digital goniometer. The spectrometer setup supplied the immutability of the x-ray optical scheme upon changing the exciting flux former. As a result, we found conditions where the TXRF analysis of the testing target is more effective with the use of the PXWR exciting flux former.
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Journal of Surface Investigation
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Pleiades Publishing
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Egorov V., Egorov, E. V., Afanasev M. S. Comparative analysis of TXRF-spectroscopy efficiency under the testing target excitation by fluxes formed by the slit-cut system and waveguide-resonator // Journal of Surface Investigation. 2008. Vol. 2. No. 6. pp. 904-912.
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Egorov V., Egorov, E. V., Afanasev M. S. Comparative analysis of TXRF-spectroscopy efficiency under the testing target excitation by fluxes formed by the slit-cut system and waveguide-resonator // Journal of Surface Investigation. 2008. Vol. 2. No. 6. pp. 904-912.
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TY - JOUR
DO - 10.1134/S1027451008060141
UR - https://doi.org/10.1134/S1027451008060141
TI - Comparative analysis of TXRF-spectroscopy efficiency under the testing target excitation by fluxes formed by the slit-cut system and waveguide-resonator
T2 - Journal of Surface Investigation
AU - Egorov, V.K.
AU - Egorov,, E. V.
AU - Afanasev, M S
PY - 2008
DA - 2008/12/16
PB - Pleiades Publishing
SP - 904-912
IS - 6
VL - 2
SN - 1027-4510
SN - 1819-7094
ER -
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@article{2008_Egorov,
author = {V.K. Egorov and E. V. Egorov, and M S Afanasev},
title = {Comparative analysis of TXRF-spectroscopy efficiency under the testing target excitation by fluxes formed by the slit-cut system and waveguide-resonator},
journal = {Journal of Surface Investigation},
year = {2008},
volume = {2},
publisher = {Pleiades Publishing},
month = {dec},
url = {https://doi.org/10.1134/S1027451008060141},
number = {6},
pages = {904--912},
doi = {10.1134/S1027451008060141}
}
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Egorov, V.K., et al. “Comparative analysis of TXRF-spectroscopy efficiency under the testing target excitation by fluxes formed by the slit-cut system and waveguide-resonator.” Journal of Surface Investigation, vol. 2, no. 6, Dec. 2008, pp. 904-912. https://doi.org/10.1134/S1027451008060141.